| Advanced test methods for SRAMs: effective solutions for dynamic fault detection in nanoscaled technologies A Bosio, L Dilillo, P Girard, S Pravossoudovitch, A Virazel Springer Science & Business Media, 2009 | 103* | 2009 |
| A study of tapered 3-D TSVs for power and thermal integrity A Todri, S Kundu, P Girard, A Bosio, L Dilillo, A Virazel IEEE Transactions on Very Large Scale Integration (VLSI) Systems 21 (2), 306-319, 2012 | 90 | 2012 |
| Using TMR architectures for yield improvement J Vial, A Bosio, P Girard, C Landrault, S Pravossoudovitch, A Virazel 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI …, 2008 | 77 | 2008 |
| A reliability analysis of a deep neural network A Bosio, P Bernardi, A Ruospo, E Sanchez 2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019 | 71 | 2019 |
| Lifting: A flexible open-source fault simulator A Bosio, G Di Natale 2008 17th Asian Test Symposium, 35-40, 2008 | 69 | 2008 |
| Multiple cell upset classification in commercial SRAMs G Tsiligiannis, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Todri, ... IEEE Transactions on Nuclear Science 61 (4), 1747-1754, 2014 | 60 | 2014 |
| March AB, March AB1: new March tests for unlinked dynamic memory faults A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto IEEE International Conference on Test, 2005., 8 pp.-841, 2005 | 50 | 2005 |
| Statistical reliability estimation of microprocessor-based systems A Savino, S Di Carlo, G Politano, A Benso, A Bosio, G Di Natale IEEE Transactions on Computers 61 (11), 1521-1534, 2011 | 45 | 2011 |
| Testing a commercial MRAM under neutron and alpha radiation in dynamic mode G Tsiligiannis, L Dilillo, A Bosio, P Girard, A Todri, A Virazel, SS McClure, ... IEEE Transactions on Nuclear Science 60 (4), 2617-2622, 2013 | 44 | 2013 |
| A functional verification based fault injection environment A Benso, A Bosio, S Di Carlo, R Mariani 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007 | 43 | 2007 |
| Derric: A tool for unified logic diagnosis A Rousset, A Bosio, P Girard, C Landrault, S Pravossoudovitch, A Virazel 12th IEEE European Test Symposium (ETS'07), 13-20, 2007 | 43 | 2007 |
| Automatic March tests generation for static and dynamic faults in SRAMs A Benso, A Bosio, S Di Carlo, G Di Natale, P Prinetto European Test Symposium (ETS'05), 122-127, 2005 | 35 | 2005 |
| Evaluating convolutional neural networks reliability depending on their data representation A Ruospo, A Bosio, A Ianne, E Sanchez 2020 23rd Euromicro Conference on Digital System Design (DSD), 672-679, 2020 | 34 | 2020 |
| Survey on approximate computing and its intrinsic fault tolerance G Rodrigues, F Lima Kastensmidt, A Bosio Electronics 9 (4), 557, 2020 | 34 | 2020 |
| Cross-layer system reliability assessment framework for hardware faults A Vallero, A Savino, G Politano, S Di Carlo, A Chatzidimitriou, S Tselonis, ... 2016 IEEE International Test Conference (ITC), 1-10, 2016 | 34 | 2016 |
| Dynamic test methods for COTS SRAMs G Tsiligiannis, L Dilillo, V Gupta, A Bosio, P Girard, A Virazel, H Puchner, ... IEEE Transactions on Nuclear Science 61 (6), 3095-3102, 2014 | 34 | 2014 |
| Syra: Early system reliability analysis for cross-layer soft errors resilience in memory arrays of microprocessor systems A Vallero, A Savino, A Chatzidimitriou, M Kaliorakis, M Kooli, M Riera, ... IEEE Transactions on Computers 68 (5), 765-783, 2018 | 32 | 2018 |
| A functional power evaluation flow for defining test power limits during at-speed delay testing M Valka, A Bosio, L Dilillo, P Girard, S Pravossoudovitch, A Virazel, ... 2011 Sixteenth IEEE European Test Symposium, 153-158, 2011 | 32 | 2011 |
| Investigating data representation for efficient and reliable convolutional neural networks A Ruospo, E Sanchez, M Traiola, I O’connor, A Bosio Microprocessors and Microsystems 86, 104318, 2021 | 29 | 2021 |
| Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes RA Fonseca, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Virazel, ... 2010 15th IEEE European Test Symposium, 132-137, 2010 | 29 | 2010 |
