Nishad K Patil
Nishad K Patil
University of Maryland College Park
Verified email at intel.com
Title
Cited by
Cited by
Year
Precursor parameter identification for insulated gate bipolar transistor (IGBT) prognostics
N Patil, J Celaya, D Das, K Goebel, M Pecht
IEEE Transactions on Reliability 58 (2), 271-276, 2009
2042009
Identification of failure precursor parameters for insulated gate bipolar transistors (IGBTs)
N Patil, D Das, K Goebel, M Pecht
2008 International conference on prognostics and health management, 1-5, 2008
882008
A prognostic approach for non-punch through and field stop IGBTs
N Patil, D Das, M Pecht
Microelectronics Reliability 52 (3), 482-488, 2012
772012
Towards accelerated aging methodologies and health management of power MOSFETs (technical brief)
JR Celaya, N Patil, S Saha, P Wysocki, K Goebel
462009
Design, modelling and simulation of vibratory micromachined gyroscopes
S Mohite, N Patil, R Pratap
Journal of Physics: Conference Series 34 (1), 757, 2006
442006
A fusion approach to IGBT power module prognostics
N Patil, D Das, C Yin, H Lu, C Bailey, M Pecht
EuroSimE 2009-10th International Conference on Thermal, Mechanical and Multi …, 2009
262009
Anomaly detection for IGBTs using Mahalanobis distance
N Patil, D Das, M Pecht
Microelectronics Reliability 55 (7), 1054-1059, 2015
232015
Failure precursors for insulated gate bipolar transistors (IGBTs)
N Patil, D Das, K Goebel, M Pecht
IET Digital Library, 2008
182008
Anomaly detection of non punch through insulated gate bipolar transistors (IGBT) by robust covariance estimation techniques
N Patil, S Menon, D Das, M Pecht
2010 2nd International Conference on Reliability, Safety and Hazard-Risk …, 2010
142010
Long term storage reliability of antifuse field programmable gate arrays
N Patil, D Das, E Scanff, M Pecht
Microelectronics Reliability 53 (12), 2052-2056, 2013
132013
Applications of health monitoring to wind turbines
MH Azarian, RSR Kumar, N Patil, A Shrivastava, MG Pecht
Proceedings of the 24th International Congress on Condition Monitoring and …, 2011
122011
Failure precursors for insulated gate bipolar transistors
N Patil, D Das, K Goebel, M Pecht
Proceedings of the 1st International Conference on Prognostics and Health …, 2008
92008
Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors Diagnostics
N Patil, D Das, M Pecht
New World Situation: New Directions in Concurrent Engineering, 643-651, 2010
62010
Design and characterization of in-plane MEMS yaw rate sensor
KP Venkatesh, N Patil, AK Pandey, R Pratap
Sadhana 34 (4), 633, 2009
32009
Prognostics of insulated gate bipolar transistors
NK Patil
12011
Evaluation of robust covariance estimation techniques for anomaly detection of insulated gate bipolar transistors (IGBT)
N Patil, S Menon, D Das, M Pecht
Smart Materials, Adaptive Structures and Intelligent Systems 44168, 769-773, 2010
12010
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Articles 1–16