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Fernanda Lima Kastensmidt
Fernanda Lima Kastensmidt
Professor de Ciência da Computação, Universidade Federal do Rio Grande do Sul
Zweryfikowany adres z inf.ufrgs.br - Strona główna
Tytuł
Cytowane przez
Cytowane przez
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Fault-tolerance techniques for SRAM-based FPGAs
FL Kastensmidt, L Carro, RA da Luz Reis
Springer, 2006
3092006
On the optimal design of triple modular redundancy logic for SRAM-based FPGAs
FL Kastensmidt, L Sterpone, L Carro, MS Reorda
Design, Automation and Test in Europe, 1290-1295, 2005
2922005
Designing fault tolerant systems into SRAM-based FPGAs
F Lima, L Carro, R Reis
Design Automation Conference, 2003. Proceedings, 650-655, 2003
1952003
Included in Your Digital Subscription Designing fault tolerant systems into SRAM-based FPGAs
F Lima, L Carro, R Reis
Design Automation Conference, 2003. Proceedings, 650-655, 2003
195*2003
A fault injection analysis of Virtex FPGA TMR design methodology
F Lima, C Carmichael, J Fabula, R Padovani, R Reis
Radiation and Its Effects on Components and Systems, 2001. 6th European …, 2001
1662001
Designing fault-tolerant techniques for SRAM-based FPGAs
FG de Lima Kastensmidt, G Neuberger, RF Hentschke, L Carro, R Reis
IEEE Design & Test of Computers 21 (6), 552-562, 2004
1612004
Analyzing area and performance penalty of protecting different digital modules with Hamming code and triple modular redundancy
R Hentschke, F Marques, F Lima, L Carro, A Susin, R Reis
Integrated Circuits and Systems Design, 2002. Proceedings. 15th Symposium on …, 2002
1482002
Using bulk built-in current sensors to detect soft errors
EH Neto, I Ribeiro, M Vieira, G Wirth, FL Kastensmidt
Ieee Micro 26 (5), 10-18, 2006
1302006
A high-fault-coverage approach for the test of data, control and handshake interconnects in mesh networks-on-chip
E Cota, FL Kastensmidt, M Cassel, M Herve, P Almeida, P Meirelles, ...
IEEE Transactions on Computers 57 (9), 1202-1215, 2008
952008
Single event transients in logic circuits—load and propagation induced pulse broadening
G Wirth, FL Kastensmidt, I Ribeiro
IEEE Transactions on Nuclear Science 55 (6), 2928-2935, 2008
922008
Using benchmarks for radiation testing of microprocessors and FPGAs
H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ...
IEEE Transactions on Nuclear Science 62 (6), 2547-2554, 2015
832015
Dependable network-on-chip router able to simultaneously tolerate soft errors and crosstalk
AP Frantz, FL Kastensmidt, L Carro, E Cota
2006 IEEE International Test Conference, 1-9, 2006
822006
An automatic technique for optimizing Reed-Solomon codes to improve fault tolerance in memories
G Neuberger, FG de Lima Kastensmidt, R Reis
IEEE design & test of computers 22 (1), 50-58, 2005
652005
Synchronizing triple modular redundant designs in dynamic partial reconfiguration applications
C Pilotto, JR Azambuja, FL Kastensmidt
Proceedings of the 21st annual symposium on Integrated circuits and system …, 2008
612008
Crosstalk-and SEU-aware networks on chips
AP Frantz, M Cassel, FL Kastensmidt, É Cota, L Carro
IEEE Design & Test of Computers 24 (4), 340-350, 2007
602007
Designing and testing fault-tolerant techniques for sram-based fpgas
FL Kastensmidt, G Neuberger, L Carro, R Reis
Proceedings of the 1st conference on Computing frontiers, 419-432, 2004
582004
An analytical model of the propagation induced pulse broadening (PIPB) effects on single event transient in flash-based FPGAs
L Sterpone, N Battezzati, FL Kastensmidt, R Chipana
IEEE Transactions on Nuclear science 58 (5), 2333-2340, 2011
572011
Analyzing the impact of single-event-induced charge sharing in complex circuits
S Pagliarini, F Kastensmidt, L Entrena, A Lindoso, E San Millan
IEEE Transactions on Nuclear Science 58 (6), 2768-2775, 2011
512011
Reconfigurable routers for low power and high performance
D Matos, C Concatto, M Kreutz, F Kastensmidt, L Carro, A Susin
IEEE Transactions on very large scale integration (VLSI) systems 19 (11 …, 2010
502010
Detecting SEEs in microprocessors through a non-intrusive hybrid technique
JR Azambuja, Â Lapolli, L Rosa, FL Kastensmidt
IEEE Transactions on Nuclear Science 58 (3), 993-1000, 2011
492011
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