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Co-authors
- Anantha SimhaPrincipal Research Scientist, Tata Consultancy ServicesVerified email at tcs.com
- Bighnaraj PanigrahiNokia Standards DivisionVerified email at nokia.com
- Samar ShailendraIntelVerified email at intel.com
- Shameem Raj NadafScientist , TCS Networks Lab Bangalore and Tcs Innovation Lab KolkataVerified email at tcs.com
- Dr. Arpan PalDistinguished Chief Scientist and Research Area Head, Embedded Devices and Intelligent Systems, TCSVerified email at tcs.com
- Ajay KattepurEricsson ResearchVerified email at ericsson.com
- Dr. Jyotirmoy karjeeSamsung R&D Institute India, BangaloreVerified email at samsung.com
- Visali MushunuriTata Consultancy ServicesVerified email at tcs.com
- Sipra BeheraResearcher TCS Innovation LabVerified email at tcs.com
- Abhijan BhattacharyyaTCS Research, Tata Consultancy ServicesVerified email at tcs.com
- Swades DeDepartment of Electrical Engineering, Indian Institute of Technology DelhiVerified email at ee.iitd.ac.in
- Alok RanjanResearch Architect | Bosch, IndiaVerified email at ieee.org
- Prasant MisraSenior Scientist, TCS ResearchVerified email at tcs.com
- Aniruddh Rao KabbinaleResearch and Standards Engineer, Samsung R&D Institute Bengaluru - IndiaVerified email at samsung.com
- Anirudha SahooNational Institute of Standards and TechnologyVerified email at nist.gov
- RAJAN M ASenior Scientist, TCS Research and InnovationVerified email at tcs.com
- Balamuralidhar PTCS Research, Tata Consultancy ServicesVerified email at tcs.com
- Dr. D. D. SETH , Senior Me...Professor ,CSE, SRM-IST (Deemed University),Delhi-NCR , Ghaziabad CampusVerified email at srmist.edu.in
- Kannan GovindanApple IncVerified email at cs.ucdavis.edu
- Ashkan YousefpourAI ScientistVerified email at meta.com