| An ellipsoidal mirror for focusing neutral atomic and molecular beams K Fladischer, H Reingruber, T Reisinger, V Mayrhofer, WE Ernst, AE Ross, ... New journal of Physics 12 (3), 033018, 2010 | 40 | 2010 |
| Measurements of the geometrical characteristics of the silicon wafer for helium microscope focusing mirror D Litwin, J Galas, T Kozlowski, S Sitarek Photonics Applications in Industry and Research IV 5948, 177-184, 2005 | 18 | 2005 |
| An optical profilometer for characterizing complex surfaces under high vacuum conditions K Fladischer, D Litwin, J Galas, AE Weeks, DA MacLaren, R Lammegger, ... Precision engineering 32 (3), 182-185, 2008 | 17 | 2008 |
| Accurate surface profilometry of ultrathin wafers AE Weeks, D Litwin, J Galas, B Surma, B Piatkowski, DA MacLaren, ... Semiconductor science and technology 22 (9), 997, 2007 | 17 | 2007 |
| X-ray studies of ultra-thin Si wafers for mirror application J Sass, K Mazur, B Surma, F Eichhorn, D Litwin, J Galas, S Sitarek Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2006 | 16 | 2006 |
| Interferometric and confocal techniques for testing of silicon wafers J Galas, D Litwin, S Sitarek, B Surma, B Piatkowski, A Miros Optical Micro-and Nanometrology in Microsystems Technology 6188, 84-91, 2006 | 14 | 2006 |
| Automated variable wavelength interferometry in reflected light mode D Litwin, J Galas, N Blocki Optical Micro-and Nanometrology in Microsystems Technology 6188, 112-119, 2006 | 12 | 2006 |
| Performance analysis of thermally bonded Er3+, Yb3+:glass/Co2+:MgAl2O4 microchip lasers J Mlynczak, N Belghachem, K Kopczynski, J Kisielewski, R Stepien, ... Optical and Quantum Electronics 48, 1-10, 2016 | 11 | 2016 |
| Temperature influence in confocal techniques for a silicon wafer testing D Litwin, J Galas, S Sitarek, B Surma, B Piatkowski, A Miros Optical Sensing Technology and Applications 6585, 247-254, 2007 | 10 | 2007 |
| Construction of an image recognition process on the basis of optical Fourier diffractometry: application to degraded bone structure classification J Galas, M Daszkiewicz, A Sawicki, K Godwod, J Szawdyn Optical Engineering 33 (4), 1106-1113, 1994 | 8 | 1994 |
| A fast variable wavelength interferometer D Litwin, K Radziak, J Galas Photonics Applications in Astronomy, Communications, Industry, and High …, 2020 | 6 | 2020 |
| Fringe image analysis for variable wavelength interferometry J Galas, S Sitarek, D Litwin, M Daszkiewicz Photonics Applications in Astronomy, Communications, Industry, and High …, 2017 | 6 | 2017 |
| Properties of Ceramics Derived from Direct Observations of Crack Z Librant, M Boniecki, A Gładki, M Daszkiewicz, J Galas, W ReĆko Bulletin of the Polish Academy of Sciences. Technical Sciences 47 (4), 365-377, 1999 | 6 | 1999 |
| Alternative approach to variable wavelength interferometry D Litwin, K Radziak, J Galas Photonics Letters of Poland 12 (4), 112-114, 2020 | 5 | 2020 |
| New approach for identifying the zero-order fringe in variable wavelength interferometry J Galas, D Litwin, M Daszkiewicz 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of …, 2016 | 5 | 2016 |
| Pulse laser head with monolithic thermally bonded microchip operating at 1.5 µm wavelength J Młyńczak, K Kopczyński, N Belghachem, J Kisielewski, R Stępień, ... Laser Technology 2016: Progress and Applications of Lasers 10159, 35-40, 2016 | 5 | 2016 |
| Profilometr laserowy do odtwarzania geometrii powierzchni P Czajka, W Mizak, J Galas, A Czyżewski, M Kochanowski, D Litwin, ... Przegląd Elektrotechniczny 8, 152-156, 2014 | 5 | 2014 |
| Machine learning technique for recognition of flotation froth images in a nonstable flotation process J Galas, D Litwin Minerals 12 (8), 1052, 2022 | 4 | 2022 |
| Overview of the measuring systems where a continuously altered light source plays a key role: Part II D Litwin, K Radziak, J Galas, M Daszkiewicz, T Kozłowski, T Kryszczyński Photonics Applications in Astronomy, Communications, Industry, and High …, 2019 | 4 | 2019 |
| Dedicated optical systems of the Institute of Applied Optics D Litwin, J Galas, M Daszkiewicz, T Kryszczyński, A Czyżewski, ... Photonics Letters of Poland 11 (2), 29-31, 2019 | 4 | 2019 |
