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Brice Colombier
Brice Colombier
Laboratoire Hubert Curien - Université Jean Monnet
Zweryfikowany adres z univ-st-etienne.fr - Strona główna
Tytuł
Cytowane przez
Cytowane przez
Rok
Survey of hardware protection of design data for integrated circuits and intellectual properties
B Colombier, L Bossuet
IET Computers & Digital Techniques 8 (6), 274-287, 2014
832014
Laser-induced single-bit faults in flash memory: instructions corruption on a 32-bit microcontroller
B Colombier, A Menu, JM Dutertre, PA Moëllic, JB Rigaud, JL Danger
2019 IEEE International Symposium on Hardware Oriented Security and Trust …, 2019
652019
Key reconciliation protocols for error correction of silicon PUF responses
B Colombier, L Bossuet, V Fischer, D Hély
IEEE Transactions on Information Forensics and Security 12 (8), 1988-2002, 2017
412017
Multi-spot Laser Fault Injection Setup: New Possibilities for Fault Injection Attacks
B Colombier, P Grandamme, J Vernay, É Chanavat, L Bossuet, ...
20th Smart Card Research and Advanced Application Conference-CARDIS 2021, 2021
272021
Message-Recovery Laser Fault Injection Attack on the Classic McEliece Cryptosystem
PL Cayrel, B Colombier, VF Drăgoi, A Menu, L Bossuet
Annual International Conference on the Theory and Applications of …, 2021
242021
Online Performance Evaluation of Deep Learning Networks for Profiled Side-Channel Analysis
D Robissout, G Zaid, B Colombier, L Bossuet, A Habrard
International Workshop on Constructive Side-Channel Analysis and Secure …, 2020
232020
Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation
A Menu, JM Dutertre, JB Rigaud, B Colombier, PA Moellic, JL Danger
2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), 41-48, 2020
162020
From secured logic to IP protection
B Colombier, L Bossuet, D Hély
Microprocessors and Microsystems 47, 44-54, 2016
162016
Reversible denial-of-service by locking gates insertion for IP cores design protection
B Colombier, L Bossuet, D Hély
2015 IEEE Computer Society Annual Symposium on VLSI, 210-215, 2015
132015
Profiled Side-channel Attack on Cryptosystems based on the Binary Syndrome Decoding Problem
B Colombier, VF Drăgoi, PL Cayrel, V Grosso
IEEE Transactions on Information Forensics and Security 17, 3407-3420, 2022
112022
Message-recovery Profiled Side-channel Attack on the Classic McEliece Cryptosystem.
B Colombier, VF Dragoi, PL Cayrel, V Grosso
IACR Cryptol. ePrint Arch. 2022, 125, 2022
82022
Transient effect ring oscillators leak too
U Mureddu, B Colombier, N Bochard, L Bossuet, V Fischer
2019 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 37-42, 2019
82019
Centrality indicators for efficient and scalable logic masking
B Colombier, L Bossuet, D Hély
2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 98-103, 2017
82017
Comments on “A PUF-FSM Binding Scheme for FPGA IP Protection and Pay-per-Device Licensing”
L Bossuet, B Colombier
IEEE Transactions on Information Forensics and Security 11 (11), 2624-2625, 2016
82016
Microarchitecture-aware Fault Models: Experimental Evidence and Cross-Layer Inference Methodology
I Alshaer, B Colombier, C Deleuze, V Beroulle, P Maistri
2021 16th International Conference on Design & Technology of Integrated …, 2021
52021
Solving a modified syndrome decoding problem using integer programming
VF Dragoi, PL Cayrel, B Colombier, D Bucerzan, S Hoara
International Journal of Computers Communications & Control 15 (5), 2020
52020
Polynomial structures in code-based cryptography
V Dragoi, PL Cayrel, B Colombier, T Richmond
Progress in Cryptology–INDOCRYPT 2013: 14th International Conference on …, 2013
42013
Horizontal Correlation Attack on Classic McEliece
B Colombier, V Grosso, PL Cayrel, VF Drăgoi
Cryptology ePrint Archive, 2023
32023
Variable-Length Instruction Set: Feature or Bug?
I Alshaer, B Colombier, C Deleuze, V Beroulle, P Maistri
2022 25th Euromicro Conference on Digital System Design (DSD), 464-471, 2022
32022
Backtracking search for optimal parameters of a PLL-based true random number generator
B Colombier, N Bochard, F Bernard, L Bossuet
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2020
32020
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