A robust completed local binary pattern (rclbp) for surface defect detection NK Gyimah, A Girma, MN Mahmoud, S Nateghi, A Homaifar, D Opoku 2021 IEEE International Conference on Systems, Man, and Cybernetics (SMC …, 2021 | 20 | 2021 |
A discriminative deeplab model (ddlm) for surface anomaly detection and localization NK Gyimah, KD Gupta, M Nabil, X Yan, A Girma, A Homaifar, D Opoku 2023 IEEE 13th Annual Computing and Communication Workshop and Conference …, 2023 | 3 | 2023 |