Bias-dependent imaging of the In-terminated InAs(001) surface by STM: Reconstruction and transitional defect C Kendrick, G LeLay, A Kahn Physical Review B 54 (24), 17877, 1996 | 85 | 1996 |
STM study of the organic semiconductor PTCDA on highly-oriented pyrolytic graphite C Kendrick, A Kahn, SR Forrest Applied surface science 104, 586-594, 1996 | 83 | 1996 |
Failure analysis and optimization of metal fuses for post package trimming YH Cheng, CE Kendrick 2007 IEEE International Reliability Physics Symposium Proceedings. 45th …, 2007 | 80 | 2007 |
Epitaxial growth and phase transition in multilayers of the organic semiconductor PTCDA on InAs (0 0 1) C Kendrick, A Kahn Journal of crystal growth 181 (3), 181-192, 1997 | 45 | 1997 |
Organic-inorganic interfaces: principles of quasi-epitaxy of a molecular semiconductor on inorganic compound semiconductors C Kendrick, A Kahn Applied surface science 123, 405-411, 1998 | 39 | 1998 |
Growth of the Organic Molecular Semiconductor PTCDA on Se-Passivated GaAs (100): An STM Study C Kendrick, A Kahn Surface Review and Letters 5 (01), 289-293, 1998 | 18 | 1998 |
Studies of bias temperature instabilities in 4H-SiC DMOSFETs A Ghosh, J Hao, M Cook, C Kendrick, SA Suliman, GDR Hall, T Kopley, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2020 | 16 | 2020 |
Polysilicon resistor stability under voltage stress for safe-operating area characterization C Kendrick, M Cook, JP Gambino, T Myers, J Slezak, T Hirano, T Sano, ... 2018 IEEE International Reliability Physics Symposium (IRPS), P-RT. 4-1-P-RT …, 2018 | 8 | 2018 |
Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors KEK Holden, GDR Hall, M Cook, C Kendrick, K Pabst, B Greenwood, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-10, 2021 | 4 | 2021 |
IEEE International Reliability Physics Symposium (IRPS) KE Holden, GD Hall, M Cook, C Kendrick, K Pabst, B Greenwood, ... Monterey, CA, USA, 1-10, 2021 | 3 | 2021 |
Comparison of extraction methods for threshold voltage shift in NBTI characterization YH Cheng, M Cook, C Kendrick 2020 IEEE 33rd International Conference on Microelectronic Test Structures …, 2020 | 3 | 2020 |
Reliability of NLDMOS transistors subjected to repetitive power pulses C Kendrick, R Stout, M Cook 2008 IEEE International Reliability Physics Symposium, 651-652, 2008 | 3 | 2008 |
Structural and Spectroscopic Investigation of the In-Terminated InAs (100)(4× 2)/c (8× 2) Reconstruction C Kendrick, A Kahn, G Le Lay Surface Review and Letters 5 (01), 229-234, 1998 | 2 | 1998 |
Repetitive Pulse Testing for LDMOS Transistor Reliability T Liu, M Cook, C Kendrick 2024 IEEE International Reliability Physics Symposium (IRPS), P50. RT-1-P50 …, 2024 | | 2024 |
Epitaxial growth of the organic molecular crystal PTCDA on crystalline inorganic substrates CE Kendrick Princeton University, 1997 | | 1997 |