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Sergei Kostin
Sergei Kostin
researcher of Computer Science, Tallinn University of Technology
Verified email at ati.ttu.ee
Title
Cited by
Cited by
Year
Identification and rejuvenation of nbti-critical logic paths in nanoscale circuits
M Jenihhin, G Squillero, TS Copetti, V Tihhomirov, S Kostin, M Gaudesi, ...
Journal of Electronic Testing 32, 273-289, 2016
212016
Multiple stuck-at-fault detection theorem
R Ubar, S Kostin, J Raik
2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012
202012
Hierarchical identification of NBTI-critical gates in nanoscale logic
S Kostin, J Raik, R Ubar, M Jenihhin, F Vargas, LMB Poehls, TS Copetti
2014 15th Latin American Test Workshop-LATW, 1-6, 2014
152014
Spice-inspired fast gate-level computation of nbti-induced delays in nanoscale logic
S Kostin, J Raik, R Ubar, M Jenihhin, T Copetti, F Vargas, LB Poehls
2015 IEEE 18th International Symposium on Design and Diagnostics of …, 2015
14*2015
Accurate dialysis dose evaluation and extrapolation algorithms during online optical dialysis monitoring
I Fridolin, D Karai, S Kostin, R Ubar
IEEE Transactions on Biomedical Engineering 60 (5), 1371-1377, 2012
142012
Embedded fault diagnosis in digital systems with BIST
R Ubar, S Kostin, J Raik
Microprocessors and Microsystems 32 (5-6), 279-287, 2008
92008
About robustness of test patterns regarding multiple faults
R Ubar, S Kostin, J Raik
2012 13th Latin American Test Workshop (LATW), 1-6, 2012
82012
Block-level fault model-free debug and diagnosis in digital systems
R Ubar, S Kostin, J Raik
2009 12th Euromicro Conference on Digital System Design, Architectures …, 2009
82009
Multiple fault diagnosis with BDD based boolean differential equations
R Ubar, J Raik, S Kostin, J Kõusaar
2012 13th Biennial Baltic Electronics Conference, 77-80, 2012
72012
Identifying nbti-critical paths in nanoscale logic
R Ubar, F Vargas, M Jenihhin, J Raik, S Kostin, LB Poehls
2013 Euromicro Conference on Digital System Design, 136-141, 2013
62013
Embedded diagnosis in digital systems
R Ubar, S Kostin, J Raik
2008 26th International Conference on Microelectronics, 421-424, 2008
62008
Gate-level modelling of NBTI-induced delays under process variations
T Copetti, G Medeiros, LB Poehls, F Vargas, S Kostin, M Jenihhin, J Raik, ...
2016 17th Latin-American Test Symposium (LATS), 75-80, 2016
52016
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG
N Palermo, V Tihhomirov, TS Copetti, M Jenihhin, J Raik, S Kostin, ...
2015 16th Latin-American Test Symposium (LATS), 1-6, 2015
52015
Fault diagnosis in integrated circuits with BIST
R Ubar, S Kostin, J Raik, T Evartson, H Lensen
10th Euromicro Conference on Digital System Design Architectures, Methods …, 2007
52007
Fast identification of true critical paths in sequential circuits
R Ubar, S Kostin, M Jenihhin, J Raik, L Jürimägi
Microelectronics Reliability 81, 252-261, 2018
42018
How to Prove that a Circuit is Fault-Free?
R Ubar, S Kostin, J Raik
2012 15th Euromicro Conference on Digital System Design, 427-430, 2012
42012
VLSI-SoC: System-on-Chip in the Nanoscale Era–Design, Verification and Reliability
T Hollstein, J Raik, S Kostin, A Tšertov, I O'Connor, R Reis
Springer International Publishing, 2017
22017
A novel random approach to diagnostic test generation
EO Osimiry, R Ubar, S Kostin, J Raik
2016 IEEE Nordic Circuits and Systems Conference (NORCAS), 1-4, 2016
22016
A tool for random test generation targeting high diagnostic resolution
EO Osimiry, S Kostin, J Raik, R Ubar
2016 15th Biennial Baltic Electronics Conference (BEC), 79-82, 2016
22016
A tool set for teaching design-for-testability of digital circuits
S Kostin, E Orasson, R Ubar
2016 11th European Workshop on Microelectronics Education (EWME), 1-6, 2016
22016
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Articles 1–20