| Relation between image charge and potential alignment corrections for charged defects in periodic boundary conditions TR Durrant, ST Murphy, MB Watkins, AL Shluger The Journal of chemical physics 149 (2), 2018 | 69 | 2018 |
| Role of electron localization in density functionals MJP Hodgson, JD Ramsden, TR Durrant, RW Godby Physical Review B 90 (24), 241107, 2014 | 25 | 2014 |
| Role of long-range exact exchange in polaron charge transition levels: The case of MgO D Wing, J Strand, T Durrant, AL Shluger, L Kronik Physical Review Materials 4 (8), 083808, 2020 | 9 | 2020 |
| Defects in WS2 monolayer calculated with a nonlocal functional: any difference from GGA? D Kieczka, T Durrant, K Milton, KEJ Goh, M Bosman, A Shluger Electronic Structure 5 (2), 024001, 2023 | 7 | 2023 |
| Difference in Structure and Electronic Properties of Oxygen Vacancies in α-Quartz and α-Cristobalite Phases of SiO2 KL Milton, TR Durrant, T Cobos Freire, AL Shluger Materials 16 (4), 1382, 2023 | 4 | 2023 |
| Mitigating switching variability in carbon nanotube memristors J Farmer, W Whitehead, A Hall, D Veksler, G Bersuker, D Gao, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2021 | 3 | 2021 |
| Atomistic Modeling of the Electrical Conductivity of Single‐Walled Carbon Nanotube Junctions TR Durrant, AM El-Sayed, DZ Gao, T Rueckes, G Bersuker, AL Shluger physica status solidi (RRL)–Rapid Research Letters 16 (8), 2200118, 2022 | 2 | 2022 |
| Combining measurements and modeling/simulations analysis to assess carbon nanotube memory cell characteristics J Farmer, D Veksler, E Tang, G Bersuker, DZ Gao, AM El-Sayed, ... 2022 IEEE International Reliability Physics Symposium (IRPS), P36-1-P36-4, 2022 | 1 | 2022 |
| Supercell electrostatics of charged defects in periodic density functional theory TR Durrant UCL (University College London), 2019 | 1 | 2019 |
| Electron localisation in static and time-dependent one-dimensional model systems TR Durrant, MJP Hodgson, JD Ramsden, RW Godby Journal of physics: Condensed matter 30 (6), 065901, 2018 | 1 | 2018 |
| Materials-to-applications evaluation framework: assessing memristor technologies for neural network implementations G Bersuker, J Farmer, D Veksler, AM El-Sayed, T Durrant, DZ Gao, ... 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC), 1-5, 2023 | | 2023 |
| Modelling the electrical conductivity of carbon nanotube films TR Durrant, DZ Gao, Y Giret, AL Shluger | | |
