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Vincent Senez
Vincent Senez
CNRS
Verified email at univ-lille.fr
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Cited by
Year
Polydimethylsiloxane membranes for millimeter-wave planar ultra flexible antennas
N Tiercelin, P Coquet, R Sauleau, V Senez, H Fujita
Journal of Micromechanics and Microengineering 16 (11), 2389, 2006
1402006
Strain determination in silicon microstructures by combined convergent beam electron diffraction, process simulation, and micro-Raman spectroscopy
V Senez, A Armigliato, I De Wolf, G Carnevale, R Balboni, S Frabboni, ...
Journal of Applied Physics 94 (9), 5574-5583, 2003
1252003
Engineering sticky superomniphobic surfaces on transparent and flexible PDMS substrate
R Dufour, M Harnois, Y Coffinier, V Thomy, R Boukherroub, V Senez
Langmuir 26 (22), 17242-17247, 2010
942010
Analysis and application of a viscoelastic model for silicon oxidation
V Senez, D Collard, B Baccus, M Brault, J Lebailly
Journal of applied physics 76 (6), 3285-3296, 1994
881994
Zipping effect on omniphobic surfaces for controlled deposition of minute amounts of fluid or colloids
R Dufour, P Brunet, M Harnois, R Boukherroub, V Thomy, V Senez
Small 8 (8), 1229-1236, 2012
832012
Two-dimensional simulation of local oxidation of silicon: calibrated viscoelastic flow analysis
V Senez, D Collard, P Ferreira, B Baccus
IEEE Transactions on Electron Devices 43 (5), 720-731, 1996
801996
Contact angle hysteresis origins: Investigation on super-omniphobic surfaces
R Dufour, M Harnois, V Thomy, R Boukherroub, V Senez
Soft Matter 7 (19), 9380-9387, 2011
782011
Formation of silicon islands on a silicon on insulator substrate upon thermal annealing
B Legrand, V Agache, JP Nys, V Senez, D Stiévenard
Applied Physics Letters 76 (22), 3271-3273, 2000
642000
Wettability of PEDOT: PSS films
C Duc, A Vlandas, GG Malliaras, V Senez
Soft Matter 12 (23), 5146-5153, 2016
592016
From micro to nano reentrant structures: hysteresis on superomniphobic surfaces
R Dufour, G Perry, M Harnois, Y Coffinier, V Thomy, V Senez, ...
Colloid and Polymer Science 291, 409-415, 2013
562013
Techniques for mechanical strain analysis in sub-micrometer structures: TEM/CBED, micro-Raman spectroscopy, X-ray micro-diffraction and modeling
I De Wolf, V Senez, R Balboni, A Armigliato, S Frabboni, A Cedola, ...
Microelectronic engineering 70 (2-4), 425-435, 2003
532003
Modeling of the transient enhanced diffusion of boron implanted into preamorphized silicon
E Lampin, V Senez, A Claverie
Journal of applied physics 85 (12), 8137-8144, 1999
511999
Thermally assisted formation of silicon islands on a silicon-on-insulator substrate
B Legrand, V Agache, T Melin, JP Nys, V Senez, D Stiévenard
Journal of applied physics 91 (1), 106-111, 2002
492002
Label-free analysis of water-polluting parasite by electrochemical impedance spectroscopy
T Houssin, J Follet, A Follet, E Dei-Cas, V Senez
Biosensors and bioelectronics 25 (5), 1122-1129, 2010
472010
Measurement of the elastic and viscoelastic properties of dielectric films used in microelectronics
G Carlotti, P Colpani, D Piccolo, S Santucci, V Senez, G Socino, L Verdini
Thin Solid Films 414 (1), 99-104, 2002
432002
Acoustic tracking of Cassie to Wenzel wetting transitions
R Dufour, N Saad, J Carlier, P Campistron, G Nassar, M Toubal, ...
Langmuir 29 (43), 13129-13134, 2013
392013
Fabrication of superhydrophobic and highly oleophobic silicon-based surfaces via electroless etching method
TPN Nguyen, R Dufour, V Thomy, V Senez, R Boukherroub, Y Coffinier
Applied Surface Science 295, 38-43, 2014
352014
In-flow detection of ultra-small magnetic particles by an integrated giant magnetic impedance sensor
K Fodil, M Denoual, C Dolabdjian, A Treizebre, V Senez
Applied Physics Letters 108 (17), 2016
342016
Three-dimensional (3D) culture of adult murine colon as an in vitro model of cryptosporidiosis: Proof of concept
M Baydoun, SB Vanneste, C Creusy, K Guyot, N Gantois, M Chabe, ...
Scientific Reports 7 (1), 17288, 2017
332017
Stick–Jump (SJ) evaporation of strongly pinned nanoliter volume sessile water droplets on quick drying, micropatterned surfaces
D Debuisson, A Merlen, V Senez, S Arscott
Langmuir 32 (11), 2679-2686, 2016
302016
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