| Micro and nanoscale characterization of three dimensional surfaces. Basics and applications. Ş Ţălu Napoca Star Publishing House, Cluj-Napoca, Romania. ISBN 978-606-690-349-3., 2015 | 305 | 2015 |
| Minkowski functional characterization and fractal analysis of surfaces of titanium nitride films AG Korpi, Ş Ţălu, M Bramowicz, A Arman, S Kulesza, B Pszczolkowski, ... Materials Research Express 6 (8), 086463, 2019 | 192 | 2019 |
| A highly sensitivity and selectivity Pt-SnO2 nanoparticles for sensing applications at extremely low level hydrogen gas detection XT Yin, WD Zhou, J Li, Q Wang, FY Wu, D Dastan, D Wang, H Garmestani, ... Journal of Alloys and Compounds 805, 229-236, 2019 | 152 | 2019 |
| Micromorphology characterization of copper thin films by AFM and fractal analysis A Arman, Ş Ţălu, C Luna, A Ahmadpourian, M Naseri, ... Journal of Materials Science: Materials in Electronics 26, 9630-9639, 2015 | 112 | 2015 |
| AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates D Dallaeva, Ş Ţălu, S Stach, P Škarvada, P Tománek, L Grmela Applied Surface Science 312, 81-86, 2014 | 111 | 2014 |
| Ion implantation of copper oxide thin films; statistical and experimental results A Jafari, K Tahani, D Dastan, S Asgary, Z Shi, XT Yin, WD Zhou, ... Surfaces and Interfaces 18, 100463, 2020 | 100 | 2020 |
| Microstructure and tribological properties of FeNPs@ aC: H films by micromorphology analysis and fractal geometry S Ţălu, M Bramowicz, S Kulesza, A Shafiekhani, A Ghaderi, ... Industrial & Engineering Chemistry Research 54 (33), 8212-8218, 2015 | 91 | 2015 |
| Mathematical methods used in monofractal and multifractal analysis for the processing of biological and medical data and images Ş Ţălu ABAH Bioflux 4 (1), 1-4, 2012 | 90 | 2012 |
| Influence of scanning rate on quality of AFM image: Study of surface statistical metrics D Sobola, Ş Ţălu, S Solaymani, L Grmela Microscopy Research and Technique 80 (12), 1328-1336, 2017 | 89 | 2017 |
| Tin dioxide nanoparticles with high sensitivity and selectivity for gas sensors at sub-ppm level of hydrogen gas detection XT Yin, WD Zhou, J Li, P Lv, Q Wang, D Wang, F Wu, D Dastan, ... Journal of Materials Science: Materials in Electronics 30, 14687-14694, 2019 | 88 | 2019 |
| Fractal features of carbon-nickel composite thin films. Ş Ţălu, M Bramowicz, S Kulesza, V Dalouji, S Solaymani, S Valedbagi Microscopy Research and Technique 79 (12), 1208-1213, 2016 | 87 | 2016 |
| Statistical, morphological, and corrosion behavior of PECVD derived cobalt oxide thin films A Jafari, MH Alam, D Dastan, S Ziakhodadadian, Z Shi, H Garmestani, ... Journal of Materials Science: Materials in Electronics 30, 21185-21198, 2019 | 80 | 2019 |
| Evolution of rough-surface geometry and crystalline structures of aligned TiO2 nanotubes for photoelectrochemical water splitting M Zare, S Solaymani, A Shafiekhani, S Kulesza, Ş Ţălu, M Bramowicz Scientific Reports, ISSN 2045-2322 (online) 8 (article number: 10870), 1-11, 2018 | 79 | 2018 |
| Overview of the current state of Gallium Arsenide-based solar cells N Papež, R Dallaev, Ş Ţălu, J Kaštyl Materials 14 (11), 3075, 2021 | 78 | 2021 |
| Stereometric parameters of the Cu/Fe NPs thin films S Stach, Z Garczyk, S Talu, S Solaymani, A Ghaderi, R Moradian, ... The Journal of Physical Chemistry C 119 (31), 17887-17898, 2015 | 78 | 2015 |
| Electrodeposition, characterization, and antibacterial activity of zinc/silver particle composite coatings Y Reyes-Vidal, R Suarez-Rojas, C Ruiz, J Torres, Ş Ţălu, A Méndez, ... Applied Surface Science 342, 34-41, 2015 | 75 | 2015 |
| Microstructure, morphology and electrochemical properties of Co nanoflake water oxidation electrocatalyst at micro-and nanoscale N Naseri, S Solaymani, A Ghaderi, M Bramowicz, S Kulesza, Ş Ţălu, ... RSC advances 7 (21), 12923-12930, 2017 | 74 | 2017 |
| Morphological features in aluminum nitride epilayers prepared by magnetron sputtering S Stach, D Dallaeva, Ş Ţălu, P Kaspar, P Tománek, S Giovanzana, ... Materials Science-Poland 33 (1), 175-184, 2015 | 73 | 2015 |
| Stereometric analysis of TiO2 thin films deposited by electron beam ion assisted R Shakoury, A Arman, Ş Ţălu, D Dastan, C Luna, S Rezaee Optical and Quantum Electronics 52 (5), 270, 2020 | 72 | 2020 |
| Topographic characterization of Cu–Ni NPs@ aC: H films by AFM and multifractal analysis S Talu, S Stach, T Ghodselahi, A Ghaderi, S Solaymani, A Boochani, ... The Journal of Physical Chemistry B 119 (17), 5662-5670, 2015 | 71 | 2015 |
Mihai TaluZweryfikowany adres z edu.ucv.ro
