Rajat Sainju
Tytuł
Cytowane przez
Cytowane przez
Rok
Deep learning for semantic segmentation of defects in advanced STEM images of steels
G Roberts, SY Haile, R Sainju, DJ Edwards, B Hutchinson, Y Zhu
Scientific reports 9 (1), 1-12, 2019
542019
DefectNet–A Deep Convolutional Neural Network for Semantic Segmentation of Crystallographic Defects in Advanced Microscopy Images
G Roberts, R Sainju, B Hutchinson, MB Toloczko, DJ Edwards, Y Zhu
Microscopy and Microanalysis 25 (S2), 164-165, 2019
32019
Direct observation of tungsten oxidation studied by in situ environmental TEM
M Togaru, R Sainju, L Zhang, W Jiang, Y Zhu
Materials Characterization 174, 111016, 2021
12021
Detecting Gender Bias in Transformer-based Models: A Case Study on BERT
B Li, H Peng, R Sainju, J Yang, L Yang, Y Liang, W Jiang, B Wang, H Liu, ...
arXiv preprint arXiv:2110.15733, 2021
2021
Deep Learning-based Computer Vision for Radiation Defect Analysis: from Static Defect Segmentation to Dynamic Defect Tracking
R Sainju, WY Chen, S Schaefer, G Roberts, M Toloczko, D Edwards, M Li, ...
Microscopy and Microanalysis 27 (S1), 1464-1465, 2021
2021
Tracking and Understanding Nanocatalyst Sintering and Regeneration using Deep Learning-assisted In Situ Environmental TEM
R Sainju, S Suib, C Ding, Y Zhu
Microscopy and Microanalysis 27 (S1), 2216-2217, 2021
2021
Towards an End-to-end Radiation Defect Quantitative Characterization Workflow Using Advanced Microscopy Images
R Sainju, G Roberts, C Ophus, B Hutchinson, J Wang, MB Toloczko, ...
Microscopy and Microanalysis 26 (S2), 1112-1114, 2020
2020
Automated Quantitative Analysis of Extended Irradiation Defects-Dislocations, Voids and Precipitates in Neutron Irradiated HT-9 Steel
R Sainju, C Ophus, MB Toloczko, DJ Edwards, Y Zhu
Microscopy and Microanalysis 25 (S2), 1564-1565, 2019
2019
ADVANCED-STEM-BASED DEEP LEARNING FOR SEMANTIC SEGMENTATION OF DEFECTS IN STEELS
Y Zhu, GW Roberts, R Sainju, BJ Hutchinson, RJ Kurtz, MB Toloczko, ...
Pacific Northwest National Lab.(PNNL), Richland, WA (United States), 2019
2019
430–Towards an End-to-End Radiation Defect Quantitative Characterization Workflow Using Advanced Microscopy Images
Y Zhu, R Sainju, G Roberts, C Ophus, B Hutchinson, J Wang, M Toloczko, ...
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