| Atomic resolution imaging of grain boundary defects in monolayer chemical vapor deposition-grown hexagonal boron nitride AL Gibb, N Alem, JH Chen, KJ Erickson, J Ciston, A Gautam, M Linck, ... Journal of the American Chemical Society 135 (18), 6758-6761, 2013 | 194 | 2013 |
| Electron holography: Applications to materials questions H Lichte, P Formanek, A Lenk, M Linck, C Matzeck, M Lehmann, P Simon Annu. Rev. Mater. Res. 37, 539-588, 2007 | 139 | 2007 |
| Controlled growth of a line defect in graphene and implications for gate-tunable valley filtering JH Chen, G Autès, N Alem, F Gargiulo, A Gautam, M Linck, C Kisielowski, ... Physical Review B 89 (12), 121407, 2014 | 112 | 2014 |
| Chromatic aberration correction for atomic resolution TEM imaging from 20 to 80 kV M Linck, P Hartel, S Uhlemann, F Kahl, H Müller, J Zach, M Haider, ... Physical review letters 117 (7), 076101, 2016 | 82 | 2016 |
| Efficient diffractive phase optics for electrons TR Harvey, JS Pierce, AK Agrawal, P Ercius, M Linck, BJ McMorran New Journal of Physics 16 (9), 093039, 2014 | 72 | 2014 |
| State of the art in atomic resolution off-axis electron holography M Linck, B Freitag, S Kujawa, M Lehmann, T Niermann Ultramicroscopy 116, 13-23, 2012 | 49 | 2012 |
| Electron holography with a Cs-corrected transmission electron microscope D Geiger, H Lichte, M Linck, M Lehmann Microscopy and Microanalysis 14 (1), 68, 2008 | 42 | 2008 |
| Off-axis electron holography in an aberration-corrected transmission electron microscope H Lichte, D Geiger, M Linck Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009 | 37 | 2009 |
| Imaging modes for potential mapping in semiconductor devices by electron holography with improved lateral resolution J Sickmann, P Formánek, M Linck, U Muehle, H Lichte Ultramicroscopy 111 (4), 290-302, 2011 | 35 | 2011 |
| Origins and demonstrations of electrons with orbital angular momentum BJ McMorran, A Agrawal, PA Ercius, V Grillo, AA Herzing, TR Harvey, ... Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2017 | 29 | 2017 |
| Ferroelectric effects in individual BaTiO 3 nanocrystals investigated by electron holography D Szwarcman, A Lubk, M Linck, K Vogel, Y Lereah, H Lichte, G Markovich Physical Review B 85 (13), 134112, 2012 | 21 | 2012 |
| Off-axis electron holography: Materials analysis at atomic resolution: Dedicated to Professor Dr. Knut Urban on the occasion of his 65th birthday M Linck, H Lichte, M Lehmann Zeitschrift für Metallkunde 97 (7), 890-898, 2006 | 15 | 2006 |
| Aberration corrected STEM by means of diffraction gratings M Linck, PA Ercius, JS Pierce, BJ McMorran Ultramicroscopy 182, 36-43, 2017 | 13 | 2017 |
| Aberration correction and electron holography H Lichte, M Linck, D Geiger, M Lehmann Microscopy and Microanalysis 16 (4), 434, 2010 | 12 | 2010 |
| Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples C Ophus, HI Rasool, M Linck, A Zettl, J Ciston Advanced structural and chemical imaging 2 (1), 1-10, 2016 | 10 | 2016 |
| A flexible multi-stimuli in situ (S) TEM: Concept, optical performance, and outlook F Börrnert, H Müller, T Riedel, M Linck, AI Kirkland, M Haider, B Büchner, ... Ultramicroscopy 151, 31-36, 2015 | 7 | 2015 |
| Optimum aberration coefficients for recording high-resolution off-axis holograms in a Cs-corrected TEM M Linck Ultramicroscopy 124, 77-87, 2013 | 6 | 2013 |
| New possibilities for off-axis electron holography by hardware aberration correctors M Linck, J Sickmann, P Hartel, H Müller Microscopy and Microanalysis 16 (S2), 94-95, 2010 | 5 | 2010 |
| Aberration-corrected stem by means of diffraction gratings M Linck, B McMorran, J Pierce, P Ercius Microscopy and Microanalysis 20 (S3), 946-947, 2014 | 4 | 2014 |
| Applied wave optics on the atomic scale: Electron holography materials characterization in a Titan TEM M Linck, M Lehmann, B Freitag, S Kujawa, T Niermann Microscopy Conference 2009, Graz (Austria), 30 Aug - 4 Sept 2009 1 (MC2009 …, 2009 | 4 | 2009 |
Heiko MüllerScientist, CEOS GmbH, Heidelberg, GermanyZweryfikowany adres z ceos-gmbh.de
