Sergio L. Morelhao

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	Wszystkie	Od 2019
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Lisandro Pavie CardosoProfessor Titular Aposentado do Instituto de Física Gleb Wataghin da Universidade Estadual deZweryfikowany adres z ifi.unicamp.br
Avanci L H Professor de Física, FEI - Centro Universitário da FEIZweryfikowany adres z fei.edu.br
Stefan KyciaUniversity of GuelphZweryfikowany adres z uoguelph.ca
Celso I. FornariEPVII, Würzburg UniversitätZweryfikowany adres z physik.uni-wuerzburg.de
José Marcos SasakiProfessor Titular do Departamento de Física, Universidade Federal do Ceará-UFCZweryfikowany adres z fisica.ufc.br
Paulo Henrique de Oliveira RapplInstituto Nacional de Pesquisas Espaciais-INPEZweryfikowany adres z inpe.br
Alain André QuivyProfessor, Instituto de Física, Universidade de São PauloZweryfikowany adres z if.usp.br
Raul O. FreitasBrazilian Synchrotron Light LaboratoryZweryfikowany adres z lnls.br
Adenilson Oliveira dos SantosUniversidade Federal do MaranhãoZweryfikowany adres z ufma.br
Cesar CusatisFisica, UFPRZweryfikowany adres z fisica.ufpr.br
Ferenc RieszHUN-REN Centre for Energy Research, Institute for Technical Physics andZweryfikowany adres z mfa.kfki.hu
G.E.S. BritoProfessor do Departamento de Física Aplicada do Instituto de Física da USPZweryfikowany adres z if.usp.br
Marcelo Goncalves HonnickeUniversidade Federal da Integração Latino-AmericanaZweryfikowany adres z unila.edu.br
L C KretlyProfessor Uuniversity of Campinas , UNICAMP, Campinas,SP, BRAZILZweryfikowany adres z dmo.fee.unicamp.br
Jaroslaw Z. DomagalaInstitute of Physics, Polish Academy of Science, Warsaw, PolandZweryfikowany adres z ifpan.edu.pl
Marcus A R MirandaUniversidade da Integração Internacional da Lusofonia Afro-Brasileira - UnilabZweryfikowany adres z unilab.edu.br
Alan Silva de MenezesPhysics Department, Federal University of MaranhãoZweryfikowany adres z ufma.br
Michał LeszczynskiZweryfikowany adres z unipress.waw.pl
Antonio de Campos SachsColaborador no LARC, Escola Politécnica - USPZweryfikowany adres z larc.usp.br

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Sergio L. Morelhao

Institute of Physics, University of Sao Paulo, Brazil

Zweryfikowany adres z if.usp.br

X-ray physics in Materials and Life Science


Tytuł Sortuj wg cytatów Sortuj wg roku Sortuj wg tytułu	Cytowane przez Cytowane przez	Rok
Structural properties of Bi2Te3 topological insulator thin films grown by molecular beam epitaxy on (111) BaF2 substrates CI Fornari, PHO Rappl, SL Morelhão, E Abramof Journal of Applied Physics 119 (16), 2016	60	2016
Computer simulation tools for x-ray analysis: scattering and diffraction methods SL Morelhão	49	2016
X-ray multiple diffraction phenomenon in the evaluation of semiconductor crystalline perfection SL Morelhão, LP Cardoso Journal of applied crystallography 29 (4), 446-456, 1996	44	1996
Usage of Scherrer's formula in X-ray diffraction analysis of size distribution in systems of monocrystalline nanoparticles A Valério, SL Morelhao arXiv preprint arXiv:1911.00701, 2019	42	2019
Structural properties of heteroepitaxial systems using hybrid multiple diffraction in Renninger scans SL Morelhão, LP Cardoso Journal of applied physics 73 (9), 4218-4226, 1993	41	1993
Preservation of pristine Bi2Te3 thin film topological insulator surface after ex situ mechanical removal of Te capping layer CI Fornari, PHO Rappl, SL Morelhão, TRF Peixoto, H Bentmann, ... APL Materials 4 (10), 2016	36	2016
Sensitivity of Bragg surface diffraction to analyze ion-implanted semiconductors MA Hayashi, SL Morelhão, LH Avanci, LP Cardoso, JM Sasaki, LC Kretly, ... Applied Physics Letters 71 (18), 2614-2616, 1997	33	1997
Molecular beam epitaxy of antiferromagnetic (MnBi2Te4)(Bi2Te3) thin films on BaF2 (111) P Kagerer, CI Fornari, S Buchberger, SL Morelhão, RC Vidal, A Tcakaev, ... Journal of Applied Physics 128 (13), 2020	31	2020
X‐ray imaging in advanced studies of ophthalmic diseases A Antunes, AMV Safatle, PSM Barros, SL Morelhão Medical physics 33 (7Part1), 2338-2343, 2006	31	2006
Nanostructure of sol–gel films by x-ray specular reflectivity SL Morelhão, GES Brito, E Abramof Applied physics letters 80 (3), 407-409, 2002	29	2002
A versatile X-ray diffraction station at LNLS (Brazil) C Cusatis, M Kobayashi Franco, E Kakuno, C Giles, S Morelhão, V Mello, ... Journal of Synchrotron Radiation 5 (3), 491-493, 1998	29	1998
Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis SL Morelhao, CI Fornari, PHO Rappl, E Abramof Journal of Applied Crystallography 50 (2), 399-410, 2017	27	2017
Hybrid multiple diffraction in Renninger scan for heteroepitaxial layers SL Morelhão, LP Cardoso, JM Sasaki, MMG De Carvalho Journal of applied physics 70 (5), 2589-2593, 1991	27	1991
Synchrotron X‐ray Renninger scanning for studying strain in InAs/GaAs quantum dot system RO Freitas, TE Lamas, AA Quivy, SL Morelhão physica status solidi (a) 204 (8), 2548-2554, 2007	26	2007
X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals SL Morelhao, CMR Remédios, RO Freitas, AO dos Santos Journal of Applied Crystallography 44 (1), 93-101, 2011	24	2011
Enhanced X-ray phase determination by three-beam diffraction SL Morelhão, S Kycia Physical review letters 89 (1), 015501, 2002	24	2002
Strength tuning of multiple waves in crystals SL Morelhão, LH Avanci Acta Crystallographica Section A: Foundations of Crystallography 57 (2), 192-196, 2001	24	2001
An X-ray diffractometer for accurate structural invariant phase determination SL Morelhao Journal of Synchrotron Radiation 10 (3), 236-241, 2003	23	2003
Observation of coherent hybrid reflection with synchrotron radiation SL Morelhao, LH Avanci, MA Hayashi, LP Cardoso, SP Collins Applied physics letters 73 (15), 2194-2196, 1998	23	1998
Analysis of interfacial misfit dislocation by X-ray multiple diffraction SL Morelhão, LP Cardoso Solid state communications 88 (6), 465-469, 1993	23	1993

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