Andrzej Kolek
Andrzej Kolek
Dep. Electronics Fundamentals, Rzeszów University Technology, Poland
Verified email at prz.edu.pl
Title
Cited by
Cited by
Year
noise in polymer thick-film resistors
A Dziedzic, A Kolek
Journal of Physics D: Applied Physics 31 (17), 2091, 1998
531998
Advanced electrical and stability characterization of untrimmed and variously trimmed thick-film and LTCC resistors
A Dziedzic, A Kolek, W Ehrhardt, H Thust
Microelectronics Reliability 46 (2-4), 352-359, 2006
462006
Mid‐IR quantum cascade lasers: Device technology and non‐equilibrium Green's function modeling of electro‐optical characteristics
M Bugajski, P Gutowski, P Karbownik, A Kolek, G Hałdaś, K Pierściński, ...
physica status solidi (b) 251 (6), 1144-1157, 2014
452014
Modeling of Mid-Infrared Quantum Cascade Laser by Means of Nonequilibrium Green's Functions
G Haldaś, A Kolek, I Tralle
IEEE Journal of Quantum Electronics 47 (6), 878-885, 2011
452011
Nonthermal carrier distributions in the subbands of 2-phonon resonance mid-infrared quantum cascade laser
A Kolek, G Hałdaś, M Bugajski
Applied Physics Letters 101 (6), 061110, 2012
422012
1/f noise in percolation and percolationlike systems
AA Snarskii, AE Morozovsky, A Kolek, A Kusy
Physical Review E 53 (6), 5596, 1996
401996
Evaluation of conductive-to-resistive layers interaction in thick-film resistors
K Mleczko, Z Zawiślak, AW Stadler, A Kolek, A Dziedzic, J Cichosz
Microelectronics Reliability 48 (6), 881-885, 2008
222008
Multifractality and 1/f noise in the two-component random resistor network
A Kolek
Physical Review B 45 (1), 205, 1992
221992
Low-frequency noise of -glass thick resistive films
A Kolek, AW Stadler, P Ptak, Z Zawiślak, K Mleczko, P Szałański, D Żak
Journal of Applied Physics 102 (10), 103718, 2007
202007
Critical exponents for conductance and 1/f noise in discrete-lattice percolation
A Kolek, A Kusy
Journal of Physics C: Solid State Physics 21 (16), L573, 1988
191988
Measurements of low frequency noise of infrared photo-detectors with transimpedance detection system
Ł Ciura, A Kolek, W Gawron, A Kowalewski, D Stanaszek
Metrology and Measurement Systems 21 (3), 2014
182014
Impact of injector doping on threshold current of mid-infrared quantum cascade laser–non-equilibrium Green’s function analysis
A Kolek, G Hałdaś, M Bugajski, K Pierściński, P Gutowski
IEEE Journal of Selected Topics in Quantum Electronics 21 (1), 124-133, 2014
172014
Investigations on printed elastic resistors containing carbon nanotubes
M Słoma, M Jakubowska, A Kolek, K Mleczko, P Ptak, AW Stadler, ...
Journal of Materials Science: Materials in Electronics 22 (9), 1321-1329, 2011
172011
Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy
L Ciura, A Kolek, A Kębłowski, D Stanaszek, A Piotrowski, W Gawron, ...
Semiconductor Science and Technology 31 (3), 035004, 2016
162016
Noise resolution of -based resistance thermometers
P Ptak, A Kolek, Z Zawislak, AW Stadler, K Mleczko
Review of scientific instruments 76 (1), 014901, 2005
162005
Investigation of a near mid-gap trap energy level in mid-wavelength infrared InAs/GaSb type-II superlattices
J Wróbel, Ł Ciura, M Motyka, F Szmulowicz, A Kolek, A Kowalewski, ...
Semiconductor Science and Technology 30 (11), 115004, 2015
152015
Implementation of RuO2-glass based thick film resistors in cryogenic thermometry
D Żak, A Dziedzic, A Kolek, AW Stadler, K Mleczko, P Szałański, ...
Measurement Science and Technology 17 (1), 22, 2005
142005
Noise characteristics of resistors buried in low-temperature co-fired ceramics
A Kolek, P Ptak, A Dziedzic
Journal of Physics D: Applied Physics 36 (8), 1009, 2003
142003
High performance GaAs/AlGaAs quantum cascade lasers: optimization of electrical and thermal properties
M Bugajski, K Kosiel, A Szerling, P Karbownik, K Pierściński, ...
Semiconductor Lasers and Laser Dynamics V 8432, 84320I, 2012
122012
Magnetospectroscopy of symmetric and anti-symmetric states in double quantum wells
M Marchewka, EM Sheregii, I Tralle, D Ploch, G Tomaka, M Furdak, ...
Physica E: Low-dimensional Systems and Nanostructures 40 (4), 894-906, 2008
122008
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