| Metrics for evaluating performance of prognostic techniques A Saxena, J Celaya, E Balaban, K Goebel, B Saha, S Saha, ... Prognostics and Health Management, 2008. PHM 2008. International Conference …, 2008 | 415 | 2008 |
| Prognostics in battery health management K Goebel, B Saha, A Saxena, JR Celaya, JP Christophersen IEEE instrumentation & measurement magazine 11 (4), 33, 2008 | 371 | 2008 |
| Metrics for offline evaluation of prognostic performance A Saxena, J Celaya, B Saha, S Saha, K Goebel International Journal of Prognostics and Health Management 1 (1), 4-23, 2010 | 327 | 2010 |
| Precursor parameter identification for insulated gate bipolar transistor (IGBT) prognostics N Patil, J Celaya, D Das, K Goebel, M Pecht IEEE Transactions on Reliability 58 (2), 271-276, 2009 | 202 | 2009 |
| On applying the prognostics performance metrics A Saxena, J Celaya, B Saha, S Saha, K Goebel Annual Conference of the PHM Society 1, 2009 | 156 | 2009 |
| Prognostics of Power MOSFETs under Thermal Stress Accelerated Aging using Data-Driven and Model-Based Methodologies JR Celaya, A Saxena, S Saha, K Goebel Annual Conference of the Prognostics and Health Management Society, 2011 | 130* | 2011 |
| Evaluating algorithm performance metrics tailored for prognostics A Saxena, J Celaya, B Saha, S Saha, K Goebel 2009 IEEE Aerospace conference, 1-13, 2009 | 116 | 2009 |
| Towards prognostics for electronics components B Saha, JR Celaya, PF Wysocki, KF Goebel Aerospace conference, 2009 IEEE, 1-7, 2009 | 87 | 2009 |
| An agile accelerated aging, characterization and scenario simulation system for gate controlled power transistors G Sonnenfeld, K Goebel, JR Celaya 2008 IEEE AUTOTESTCON, 208-215, 2008 | 83 | 2008 |
| Towards prognostics of power mosfets: Accelerated aging and precursors of failure JR Celaya, A Saxena, P Wysocki, S Saha, K Goebel Annual Conference of the Prognostics and Health Management Society 2010, 2010 | 78 | 2010 |
| Prognostics approach for power MOSFET under thermal-stress aging JR Celaya, A Saxena, CS Kulkarni, S Saha, K Goebel Reliability and Maintainability Symposium (RAMS), 2012 Proceedings-Annual, 1-6, 2012 | 77 | 2012 |
| Modeling and analysis of multi-agent systems using petri nets JR Celaya, AA Desrochers, RJ Graves JOURNAL OF COMPUTERS 4 (10), 2009 | 76 | 2009 |
| Modeling and Analysis of Multi-agent Systems using Petri Nets J Celaya, A Desrochers, R Graves Journal of Computers 4 (10), 981-996, 2009 | 76 | 2009 |
| Modeling and analysis of multi-agent systems using petri nets JR Celaya, AA Desrochers, RJ Graves 2007 IEEE International Conference on Systems, Man and Cybernetics, 1439-1444, 2007 | 76 | 2007 |
| Modeling and analysis of multi-agent systems using petri nets JR Celaya, AA Desrochers, RJ Graves 2007 IEEE International Conference on Systems, Man and Cybernetics, 1439-1444, 2007 | 76 | 2007 |
| Modeling and analysis of multi-agent systems using petri nets JR Celaya, AA Desrochers, RJ Graves 2007 IEEE International Conference on Systems, Man and Cybernetics, 1439-1444, 2007 | 76 | 2007 |
| Modeling and analysis of multi-agent systems using petri nets JR Celaya, AA Desrochers, RJ Graves 2007 IEEE International Conference on Systems, Man and Cybernetics, 1439-1444, 2007 | 76 | 2007 |
| Accelerated aging system for prognostics of power semiconductor devices JR Celaya, P Wysocki, V Vashchenko, S Saha, K Goebel 2010 IEEE AUTOTESTCON, 1-6, 2010 | 71 | 2010 |
| A model-based prognostics methodology for electrolytic capacitors based on electrical overstress accelerated aging J Celaya, C Kulkarni, G Biswas, S Saha, K Goebel Proceedings of Annual Conference of the PHM Society, September, 25-29, 2011 | 70 | 2011 |
| Accelerated aging with electrical overstress and prognostics for power MOSFETs S Saha, JR Celaya, V Vashchenko, S Mahiuddin, KF Goebel Energytech, 2011 IEEE, 1-6, 2011 | 54 | 2011 |
Kai GoebelPrincipal Scientist at PARCVerified email at parc.com
