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Tomasz Torzewicz
Tomasz Torzewicz
mgr inż. elektroniki, Politechnika Łódzka
Verified email at dmcs.p.lodz.pl - Homepage
Title
Cited by
Cited by
Year
Behavioral Approach to SiC MPS Diode Electrothermal Model Generation
Ł Starzak, M Zubert, M Janicki, T Torzewicz, M Napieralska, G Jabłoński, ...
IEEE, 2013
512013
Automated stand for thermal characterization of electronic packages
M Janicki, Z Kulesza, T Torzewicz, A Napieralski
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM …, 2011
212011
Accuracy and boundary condition independence of Cauer RC ladder compact thermal models
M Janicki, T Torzewicz, Z Kulesza, A Napieralski
Microelectronics Journal, 2013
62013
Active control of boundary conditions for dynamic thermal characterization of electronic components
M Janicki, T Torzewicz, Z Kulesza, A Napieralski
Microelectronics Journal, 2012
52012
Active control of circuit cooling conditions for transient thermal measurement purposes
M Janicki, Z Kulesza, T Torzewicz, A Napieralski
Thermal Investigations of ICs and Systems (THERMINIC), 2011 17th …, 2011
32011
Dual cold plate system with active temperature and heat flux control
M Janicki, Z Kulesza, T Torzewicz, A Napieralski
Thermal Investigations of ICs and Systems (THERMINIC), 2012 18th …, 2012
22012
Boundary condition independence of Cauer RC ladder compact thermal models
M Janicki, T Torzewicz, Z Kulesza, A Napieralski
Proc. 15th Nanotech Conf. Expo, 833-836, 2012
22012
XIV International PhD Workshop OWD 2012, 20–23 October 2012
T Torzewicz
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