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Wieslaw Kuzmicz
Wieslaw Kuzmicz
Verified email at imio.pw.edu.pl
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Cited by
Year
Twin gate, vertical slit FET (VeSFET) for highly periodic layout and 3D integration
W Maly, N Singh, Z Chen, N Shen, X Li, A Pfitzner, D Kasprowicz, ...
Proceedings of the 18th International Conference Mixed Design of Integrated …, 2011
782011
Ionization of impurities in silicon
W Kuzmicz
Solid-state electronics 29 (12), 1223-1227, 1986
671986
CMOS standard cells characterization for defect based testing
WA Pleskacz, D Kasprowicz, T Oleszczak, W Kuzmicz
Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance …, 2001
462001
Fuzzy logic controller for rate-adaptive heart pacemaker
A Wojtasik, Z Jaworski, W Ku¼micz, A Wielgus, A Wa³kanis, D Sarna
Applied Soft Computing 4 (3), 259-270, 2004
322004
Defect-oriented fault simulation and test generation in digital circuits
W Kuzmicz, W Pleskacz, J Raik, R Ubar
Proceedings of the IEEE 2001. 2nd International Symposium on Quality …, 2001
312001
Extension of inductive fault analysis to parametric faults in analog circuits with application to test generation
Z Jaworski, M Niewczas, W Kuzmicz
Proceedings. 15th IEEE VLSI Test Symposium (Cat. No. 97TB100125), 172-176, 1997
301997
Coupling a statistical process-device simulator with a circuit layout extractor for a realistic circuit simulation of VLSI circuits
W Ku¼micz, W Denisiuk, J Gempel, Z Jaworski, M Niewczas, A Pfitzner, ...
Simulation of Semiconductor Devices and Processes: Vol. 5, 37-40, 1993
291993
Hierarchical defect-oriented fault simulation for digital circuits
M Blyzniuk, T Cibakova, E Gramatova, W Kuzmicz, M Lobur, W Pleskacz, ...
Proceedings IEEE European Test Workshop, 69-74, 2000
262000
Fuzzy logic-based diagnostic algorithm for implantable cardioverter defibrillators
A Bárdossy, A Blinowska, W Kuzmicz, J Ollitrault, M Lewandowski, ...
Artificial intelligence in medicine 60 (2), 113-121, 2014
222014
Static power consumption in nano-cmos circuits: Physics and modelling
W Kuzmicz, E Piwowarska, A Pfitzner, D Kasprowicz
2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007
222007
Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement
M Blyzniuk, I Kazymyra, W Kuzmicz, WA Pleskacz, J Raik, R Ubar
Microelectronics Reliability 41 (12), 2023-2040, 2001
192001
Hierarchical test generation for combinational circuits with real defects coverage
T Cibakova, M Fischerová, E Gramatova, W Kuzmicz, WA Pleskacz, ...
Microelectronics Reliability 42 (7), 1141-1149, 2002
172002
DOT: New deterministic defect-oriented ATPG tool
J Raik, R Ubar, J Sudbrock, W Kuzmicz, W Pleskacz
European Test Symposium (ETS'05), 96-101, 2005
152005
Statistical many-dimensional simulation of VLSI technology based on response surface methodology
MV Kazitov, WB Kuzmicz, VV Nelayev, VR Stempitsky
Third International Workshop on Nondestructive Testing and Computer …, 2000
142000
Resistive Plate Chamber (RPC) based muon trigger system for the CMS experiment–pattern comparator ASIC
Z Jaworski, IM Kudla, W Kuzmicz, M Niewczas
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1998
141998
Heavy doping parameters estimated from transistor measurements
W Kuzmicz, W Zagozdzon-Wosik
Solid-state electronics 31 (5), 911-919, 1988
131988
Defect oriented fault coverage of 100% stuck-at fault test sets
M Blyzniuk, T Cibakova, E Gramatova, W Ku¼micz, M Lobur, W Pleskacz, ...
7th International Conference Mixed Design of Integrated Circuits and Systems, 2000
122000
Estimation of probability of different functional faults caused by spot defects in VLSI circuits
M Blyzniuk, W Pleskacz, M Lobur, W Kuzmicz
Proc. International Conference on Modern Problems of Telecommunications …, 1999
121999
Defect-oriented test-and layout-generation for standard-cell ASIC designs
J Sudbrock, J Raik, R Ubar, W Kuzmicz, W Pleskacz
Digital System Design, 2005. Proceedings. 8th Euromicro Conference on, 79-82, 2005
112005
Optimization of integrated circuit technology
WB Kuzmicz, VS Malyshev, VV Nelayev, VR Stempitsky
Fourth International Workshop on Nondestructive Testing and Computer …, 2001
112001
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