Armand Béché
Armand Béché
EMAT
Zweryfikowany adres z uantwerpen.be - Strona główna
Tytuł
Cytowane przez
Cytowane przez
Rok
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction
K Müller, FF Krause, A Béché, M Schowalter, V Galioit, S Löffler, ...
Nature communications 5 (1), 1-8, 2014
1612014
Theory and applications of free-electron vortex states
KY Bliokh, IP Ivanov, G Guzzinati, L Clark, R Van Boxem, A Béché, ...
Physics Reports 690, 1-70, 2017
1452017
Magnetic monopole field exposed by electrons
A Béché, R Van Boxem, G Van Tendeloo, J Verbeeck
Nature Physics 10 (1), 26-29, 2014
1422014
Improved precision in strain measurement using nanobeam electron diffraction
A Béché, JL Rouvière, L Clément, JM Hartmann
Applied Physics Letters 95 (12), 123114, 2009
1412009
Strain measurement at the nanoscale: comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron …
A Béché, JL Rouvière, JP Barnes, D Cooper
Ultramicroscopy 131, 10-23, 2013
1092013
Improved strain precision with high spatial resolution using nanobeam precession electron diffraction
JL Rouviere, A Béché, Y Martin, T Denneulin, D Cooper
Applied Physics Letters 103 (24), 241913, 2013
952013
A new way of producing electron vortex probes for STEM
J Verbeeck, H Tian, A Béché
Ultramicroscopy 113, 83-87, 2012
872012
A transition from local equilibrium to paraequilibrium kinetics for ferrite growth in Fe–C–Mn: A possible role of interfacial segregation
HS Zurob, CR Hutchinson, A Béché, GR Purdy, YJM Bréchet
Acta Materialia 56 (10), 2203-2211, 2008
802008
Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope
D Cooper, T Denneulin, N Bernier, A Béché, JL Rouvière
Micron 80, 145-165, 2016
742016
Exploiting lens aberrations to create electron-vortex beams
L Clark, A Béché, G Guzzinati, A Lubk, M Mazilu, R Van Boxem, ...
Physical review letters 111 (6), 064801, 2013
732013
Probing the symmetry of the potential of localized surface plasmon resonances with phase-shaped electron beams
G Guzzinati, A Béché, H Lourenco-Martins, J Martin, M Kociak, ...
Nature communications 8 (1), 1-8, 2017
642017
Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy
K Müller-Caspary, FF Krause, T Grieb, S Löffler, M Schowalter, A Béché, ...
Ultramicroscopy 178, 62-80, 2017
622017
Probing the symmetry of the potential of localized surface plasmon resonances with phase-shaped electron beams
G Guzzinati, A Béché, H Lourenco-Martins, J Martin, M Kociak, ...
Nature communications 8 (1), 1-8, 2017
622017
Dark field electron holography for quantitative strain measurements with nanometer-scale spatial resolution
D Cooper, JP Barnes, JM Hartmann, A Béché, JL Rouviere
Applied Physics Letters 95 (5), 053501, 2009
602009
Dark field electron holography for strain measurement
A Béché, JL Rouvière, JP Barnes, D Cooper
Ultramicroscopy 111 (3), 227-238, 2011
542011
Using electron vortex beams to determine chirality of crystals in transmission electron microscopy
R Juchtmans, A Béché, A Abakumov, M Batuk, J Verbeeck
Physical Review B 91 (9), 094112, 2015
512015
3D magnetic induction maps of nanoscale materials revealed by electron holographic tomography
D Wolf, LA Rodriguez, A Béché, E Javon, L Serrano, C Magen, C Gatel, ...
Chemistry of Materials 27 (19), 6771-6778, 2015
502015
Strain evolution during the silicidation of nanometer-scale SiGe semiconductor devices studied by dark field electron holography
D Cooper, A Béché, JM Hartmann, V Carron, JL Rouvière
Applied Physics Letters 96 (11), 113508, 2010
462010
Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy
A Béché, B Goris, B Freitag, J Verbeeck
Applied Physics Letters 108 (9), 093103, 2016
452016
Measuring the orbital angular momentum of electron beams
G Guzzinati, L Clark, A Béché, J Verbeeck
Physical Review A 89 (2), 025803, 2014
442014
Nie można teraz wykonać tej operacji. Spróbuj ponownie później.
Prace 1–20