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Xiang-Gen XiaDepartment of Electrical and Computer Engineering, University of Delaware, Newark, DE 19716, USAVerified email at ee.udel.edu
Rui ZhangCUHKSZ, SRIBD & National University of SingaporeVerified email at nus.edu.sg
Wenyan Ma (马文焱)National University of SingaporeVerified email at u.nus.edu
Dapeng Oliver WuCity University of Hong KongVerified email at cityu.edu.hk
Yanming Liu北京航空航天大学Verified email at buaa.edu.cn
Robert SchoberFriedrich-Alexander-University Erlangen-NurembergVerified email at fau.de
Boyu NingUniversity of Electronic Science and Technology of ChinaVerified email at std.uestc.edu.cn
Zhu HanUniversity of HoustonVerified email at uh.edu
Pengfei XiaFellow, IEEEVerified email at ieee.org
Jinho ChoiSchool of Information Technology, Deakin UniversityVerified email at deakin.edu.au
Leyi ZhangZTE corporationVerified email at zte.com.cn
Weidong MeiUniversity of Electronic Science and Technology of ChinaVerified email at uestc.edu.cn
Zhen GaoBeijing Institute of TechnologyVerified email at bit.edu.cn
Changsheng YouSouthern University of Science and TechnologyVerified email at sustech.edu.cn
Lingyang SongPeking University & Peng Cheng Laboratory, ChinaVerified email at pku.edu.cn
Qingqing Wu (武庆庆)Shanghai Jiao Tong University, Associate ProfessorVerified email at sjtu.edu.cn
Zhi-Quan LuoProfessor, The Chinese University of Hong Kong, Shenzhen, ChinaVerified email at cuhk.edu.cn
Kaiming ShenThe Chinese University of Hong Kong, ShenzhenVerified email at cuhk.edu.cn
Beixiong ZhengSouth China University of Technology (SCUT)Verified email at scut.edu.cn
Ertugrul BasarAssociate Professor, IEEE Fellow, Koç UniversityVerified email at ku.edu.tr