Patrick Heymans
Tytuł
Cytowane przez
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Feature diagrams: A survey and a formal semantics
PY Schobbens, P Heymans, JC Trigaux
14th IEEE International Requirements Engineering Conference (RE'06), 139-148, 2006
5832006
Generic semantics of feature diagrams
PY Schobbens, P Heymans, JC Trigaux, Y Bontemps
Computer networks 51 (2), 456-479, 2007
4902007
Model checking lots of systems: efficient verification of temporal properties in software product lines
A Classen, P Heymans, PY Schobbens, A Legay, JF Raskin
Proceedings of the 32nd ACM/IEEE International Conference on Software …, 2010
3802010
A proposal for a scenario classification framework
C Rolland, CB Achour, C Cauvet, J Ralyté, A Sutcliffe, N Maiden, M Jarke, ...
Requirements Engineering 3 (1), 23-47, 1998
3431998
Disambiguating the documentation of variability in software product lines: A separation of concerns, formalization and automated analysis
A Metzger, K Pohl, P Heymans, PY Schobbens, G Saval
15th IEEE International Requirements Engineering Conference (RE 2007), 243-253, 2007
3102007
Symbolic model checking of software product lines
A Classen, P Heymans, PY Schobbens, A Legay
Proceedings of the 33rd International Conference on Software Engineering …, 2011
2712011
Featured transition systems: Foundations for verifying variability-intensive systems and their application to LTL model checking
A Classen, M Cordy, PY Schobbens, P Heymans, A Legay, JF Raskin
IEEE Transactions on Software Engineering 39 (8), 1069-1089, 2012
2342012
A text-based approach to feature modelling: Syntax and semantics of TVL
A Classen, Q Boucher, P Heymans
Science of Computer Programming 76 (12), 1130-1143, 2011
2292011
What’s in a Feature: A Requirements Engineering Perspective
A Classen, P Heymans, PY Schobbens
International Conference on Fundamental Approaches to Software Engineering …, 2008
2272008
Reprogramming of tumor-associated macrophages with anticancer therapies: radiotherapy versus chemo-and immunotherapies
G Genard, S Lucas, C Michiels
Frontiers in immunology 8, 828, 2017
2122017
Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon
IEEE Transactions on Software Engineering 40 (7), 650-670, 2014
1892014
Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon
IEEE Transactions on Software Engineering 40 (7), 650-670, 2014
1892014
Analysing the cognitive effectiveness of the BPMN 2.0 visual notation
N Genon, P Heymans, D Amyot
International conference on software language engineering, 377-396, 2010
1862010
On extracting feature models from product descriptions
M Acher, A Cleve, G Perrouin, P Heymans, C Vanbeneden, P Collet, ...
Proceedings of the Sixth International Workshop on Variability Modeling of …, 2012
1812012
A systematic approach to define the domain of information system security risk management
É Dubois, P Heymans, N Mayer, R Matulevičius
Intentional Perspectives on Information Systems Engineering, 289-306, 2010
1722010
Visual syntax does matter: improving the cognitive effectiveness of the i* visual notation
DL Moody, P Heymans, R Matulevičius
Requirements Engineering 15 (2), 141-175, 2010
1692010
Feature model extraction from large collections of informal product descriptions
JM Davril, E Delfosse, N Hariri, M Acher, J Cleland-Huang, P Heymans
Proceedings of the 2013 9th Joint Meeting on Foundations of Software …, 2013
1592013
Bubbles in anti-de Sitter space
D Birmingham, M Rinaldi
Physics Letters B 544 (3-4), 316-320, 2002
129*2002
Model checking software product lines with SNIP
A Classen, M Cordy, P Heymans, A Legay, PY Schobbens
International Journal on Software Tools for Technology Transfer 14 (5), 589-612, 2012
1162012
Improving the effectiveness of visual representations in requirements engineering: An evaluation of i* visual syntax
DL Moody, P Heymans, R Matulevicius
2009 17th IEEE International Requirements Engineering Conference, 171-180, 2009
1132009
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