| Size effects on the thermal conductivity of amorphous silicon thin films JL Braun, CH Baker, A Giri, M Elahi, K Artyushkova, TE Beechem, ... Physical Review B 93 (14), 140201, 2016 | 131 | 2016 |
| High in-plane thermal conductivity of aluminum nitride thin films MSB Hoque, YR Koh, JL Braun, A Mamun, Z Liu, K Huynh, ME Liao, ... ACS nano 15 (6), 9588-9599, 2021 | 65 | 2021 |
| Thermal conductivity measurements of sub-surface buried substrates by steady-state thermoreflectance MSB Hoque, YR Koh, K Aryana, ER Hoglund, JL Braun, DH Olson, ... Review of Scientific Instruments 92 (6), 2021 | 25 | 2021 |
| Nanoscale size effects on the mechanical properties of platinum thin films and cross-sectional grain morphology K Abbas, S Alaie, MG Baboly, MMM Elahi, DH Anjum, S Chaieb, ... Journal of Micromechanics and Microengineering 26 (1), 015007, 2015 | 21 | 2015 |
| Comparison of variations in MOSFET versus CNFET in gigascale integrated systems AAM Shahi, P Zarkesh-Ha, M Elahi Thirteenth International Symposium on Quality Electronic Design (ISQED), 378 …, 2012 | 16 | 2012 |
| Determination of etching parameters for pulsed XeF2 etching of silicon using chamber pressure data D Sarkar, MG Baboly, MM Elahi, K Abbas, J Butner, D Piñon, TL Ward, ... Journal of Micromechanics and Microengineering 28 (4), 045007, 2018 | 9 | 2018 |
| Reduction and Increase in Thermal Conductivity of Si Irradiated with Ga+ via Focused Ion Beam S Alaie, MG Baboly, YB Jiang, S Rempe, DH Anjum, S Chaieb, ... ACS applied materials & interfaces 10 (43), 37679-37684, 2018 | 7 | 2018 |
| Pulsed vacuum and etching systems: Theoretical design considerations for a pulsed vacuum system and its application to XeF2 etching of Si AK Mousavi, K Abbas, MMM Elahi, E Lima, S Moya, JD Butner, D Piñon, ... Vacuum 109, 216-222, 2014 | 6 | 2014 |
| In vitro Rapid Regeneration of Betel Vine (Piper betle L.) MM Elahi, H Huq, ME Hoque, F Khatun Journal of Advances in Biology & Biotechnology 16 (3), 1-11, 2017 | 4 | 2017 |
| 1-D thermoreflectance measurement technique for freestanding micro/nano cantilever beams MM Elahi, M Ghasemi Baboly, ZC Leseman ASME International Mechanical Engineering Congress and Exposition 50626 …, 2016 | 4 | 2016 |
| Determination of etching parameters for pulsed xenon difluoride (xef2) etching of silicon using chamber pressure data Z Leseman, K Abbas, J Butner, M Elahi, D Pinon US Patent App. 14/785,819, 2016 | 3 | 2016 |
| Thermoreflectance Technique for Thermal Properties Measurement of Micro/Nanoscale Cantilever Beams MMM Elahi The University of New Mexico, 2017 | 1 | 2017 |
| Method and system for the determination of volumes of vacuum chambers and equilibrium times for a vaccuum system Z Leseman, K Abbas, M Elahi, AK Mousavi, E Lima, S Moya US Patent App. 15/027,046, 2016 | | 2016 |
