Obserwuj
Xin Yan
Xin Yan
Zweryfikowany adres z mst.edu
Tytuł
Cytowane przez
Cytowane przez
Rok
Improved-sensitivity resonant electric-field probes based on planar spiral stripline and rectangular plate structure
J Wang, Z Yan, W Liu, X Yan, J Fan
IEEE Transactions on Instrumentation and Measurement 68 (3), 882-894, 2018
462018
Noncontact wideband current probes with high sensitivity and spatial resolution for noise location on PCB
Z Yan, W Liu, J Wang, D Su, X Yan, J Fan
IEEE Transactions on Instrumentation and Measurement 67 (12), 2881-2891, 2018
422018
A high-sensitivity resonant tangential E-probe with loaded improved dipole and embedded integrated balun
J Wang, Z Yan, W Liu, D Su, X Yan, J Fan
IEEE Transactions on Instrumentation and Measurement 68 (8), 3042-3044, 2019
302019
A miniature high-sensitivity active electric field probe for near-field measurement
Z Min, Z Yan, W Liu, J Wang, D Su, X Yan
IEEE Antennas and Wireless Propagation Letters 18 (12), 2552-2556, 2019
282019
MoM-based ground current reconstruction in RFI application
Q Huang, L Li, X Yan, B Bae, H Park, C Hwang, J Fan
IEEE Transactions on Electromagnetic Compatibility 60 (4), 1121-1128, 2018
272018
MoM based current reconstruction using near-field scanning
Q Huang, L Li, X Yan, B Bae, H Park, C Hwang, J Fan
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2017
272017
Characterization of ESD risk for wearable devices
J Zhou, K Ghosh, S Xiang, X Yan, A Hosseinbeig, J Lee, D Pommerenke
IEEE Transactions on Electromagnetic Compatibility 60 (5), 1313-1321, 2018
262018
An ultrawideband electric probe based on U-shaped structure for near-field measurement from 9 kHz to 40 GHz
W Liu, Z Yan, J Wang, X Yan, J Fan
IEEE Antennas and Wireless Propagation Letters 18 (6), 1283-1287, 2019
252019
A novel tangential electric-field sensor based on electric dipole and integrated balun for the near-field measurement covering GPS band
J Wang, Z Yan, W Liu, D Su, X Yan
Sensors 19 (9), 1970, 2019
162019
SNR analysis and optimization in near-field scanning and EMI applications
G Maghlakelidze, X Yan, L Guan, S Marathe, Q Huang, B Bae, C Hwang, ...
IEEE Transactions on Electromagnetic Compatibility 60 (4), 1087-1094, 2018
122018
An ESD demonstrator system for evaluating the ESD risks of wearable devices
J Zhou, Z Legenzoff, X Yan, S Yang, S Xiang, S Shinde, J Lee, ...
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 1-7, 2017
122017
A 20 GHz landing probe design based on pogo-pins
X Yan, Y Wang, J ZhOU, T Li, J Fan
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and …, 2018
72018
Optimizing measurement SNR for weak near-field scanning applications
L Guan, G Maghlakelidze, X Yan, S Shinde, D Pommerenke
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2017
52017
A practical simulation flow for singing capacitor based acoustic noise analysis
X Yan, S Wu, M Xue, CKB Leung, D Beetner, J Zhang
2022 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2022
42022
Investigations into methods to stabilize the spark in air discharge ESD
J Zhou, K Zhou, X Yan, L Shen, D Pommerenke, G Luo
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal …, 2019
42019
A methodology for predicting acoustic noise from singing capacitors in mobile devices
X Yan, J Zhang, S Wu, MF Xue, CKB Leung, EA MacIntosh, DG Beetner
IEEE Transactions on Electromagnetic Compatibility, 2023
32023
EMI investigation and mitigation of flexible flat cables and connectors
X Yan, C Wu, D Zhang, S Jin, S Wu, J Fan, C Hwang
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 515-519, 2021
32021
Investigation and mitigation of radio frequency interference caused by weak grounding of USB type-C receptacle connector
A Huang, X Yan, J Sun, Q Huang, J Fan, S Wu, D Zhang, H Liao, S Jin, ...
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2020
32020
Spatial resolution study for magnetic near-field probe
X Yan
Missouri University of Science and Technology, 2018
32018
Microwave Holography for EMI Source Imaging
X Yan, J Li, W Zhang, K Ghosh, P Sochoux, DG Beetner, V Khilkevich
IEEE Transactions on Electromagnetic Compatibility, 2023
12023
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