Solid-State Electron KP Lee, J Brini, A Chovet, CA Dimitriadis
Solid-State Electron 46, 1433-1440, 2002
368 * 2002 Electronic properties of semiconducting FeSi2 films CA Dimitriadis, JH Werner, S Logothetidis, M Stutzmann, J Weber, ...
Journal of applied physics 68 (4), 1726-1734, 1990
308 1990 A SEM-EBIC minority-carrier diffusion-length measurement technique DE Ioannou, CA Dimitriadis
IEEE Transactions on Electron Devices 29 (3), 445-450, 1982
144 1982 Performance of thin-film transistors on polysilicon films grown by low-pressure chemical vapor deposition at various pressures CA Dimitriadis, PA Coxon, L Dozsa, L Papadimitriou, N Economou
IEEE transactions on electron devices 39 (3), 598-606, 1992
139 1992 Semi-analytical modeling of short-channel effects in Si and Ge symmetrical double-gate MOSFETs A Tsormpatzoglou, CA Dimitriadis, R Clerc, Q Rafhay, G Pananakakis, ...
IEEE Transactions on Electron devices 54 (8), 1943-1952, 2007
118 2007 On-current modeling of large-grain polycrystalline silicon thin-film transistors FV Farmakis, J Brini, G Kamarinos, CT Angelis, CA Dimitriadis, ...
IEEE Transactions on Electron Devices 48 (4), 701-706, 2001
115 2001 Threshold voltage model for short-channel undoped symmetrical double-gate MOSFETs A Tsormpatzoglou, CA Dimitriadis, R Clerc, G Pananakakis, G Ghibaudo
IEEE Transactions on Electron Devices 55 (9), 2512-2516, 2008
112 2008 Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors CT Angelis, CA Dimitriadis, M Miyasaka, FV Farmakis, G Kamarinos, ...
Journal of applied physics 86 (8), 4600-4606, 1999
104 1999 Effect of pressure on the growth of crystallites of low‐pressure chemical‐vapor‐deposited polycrystalline silicon films and the effective electron mobility under high normal … CA Dimitriadis, J Stoemenos, PA Coxon, S Friligkos, J Antonopoulos, ...
Journal of applied physics 73 (12), 8402-8411, 1993
103 1993 Advances in the electrical assessment of semiconductors using the scanning electron microscope SM Davidson, CA Dimitriadis
Journal of microscopy 118 (3), 275-290, 1980
95 1980 Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors FV Farmakis, J Brini, G Kamarinos, CA Dimitriadis
IEEE Electron Device Letters 22 (2), 74-76, 2001
92 2001 Determination of bulk states and interface states distributions in polycrystalline silicon thin‐film transistors CA Dimitriadis, DH Tassis, NA Economou, AJ Lowe
Journal of applied physics 74 (4), 2919-2924, 1993
90 1993 Study of leakage current in -channel and -channel polycrystalline silicon thin-film transistors by conduction and low frequency noise measurements CT Angelis, CA Dimitriadis, I Samaras, J Brini, G Kamarinos, ...
Journal of applied physics 82 (8), 4095-4101, 1997
81 1997 Semianalytical modeling of short-channel effects in lightly doped silicon trigate MOSFETs A Tsormpatzoglou, CA Dimitriadis, R Clerc, G Pananakakis, G Ghibaudo
IEEE transactions on electron devices 55 (10), 2623-2631, 2008
80 2008 Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs EG Ioannidis, CA Dimitriadis, S Haendler, RA Bianchi, J Jomaah, ...
Solid-state electronics 76, 54-59, 2012
75 2012 Schottky barrier contacts of titanium nitride on n ‐type silicon CA Dimitriadis, S Logothetidis, I Alexandrou
Applied physics letters 66 (4), 502-504, 1995
75 1995 Growth mechanism and morphology of semiconducting FeSi2 films CA Dimitriadis, JH Werner
Journal of applied physics 68 (1), 93-96, 1990
67 1990 Compact model of drain current in short-channel triple-gate FinFETs N Fasarakis, A Tsormpatzoglou, DH Tassis, I Pappas, K Papathanasiou, ...
IEEE transactions on electron devices 59 (7), 1891-1898, 2012
66 2012 A compact drain current model of short-channel cylindrical gate-all-around MOSFETs A Tsormpatzoglou, DH Tassis, CA Dimitriadis, G Ghibaudo, ...
Semiconductor science and technology 24 (7), 075017, 2009
66 2009 On the threshold voltage and channel conductance of polycrystalline silicon thin‐film transistors CA Dimitriadis, DH Tassis
Journal of applied physics 79 (8), 4431-4437, 1996
61 1996