mariusz martyniuk
Tytuł
Cytowane przez
Cytowane przez
Rok
Evaluation of elastic modulus and hardness of thin films by nanoindentation
YG Jung, BR Lawn, M Martyniuk, H Huang, XZ Hu
Journal of Materials Research 19 (10), 3076-3080, 2004
2292004
New concepts in infrared photodetector designs
P Martyniuk, J Antoszewski, M Martyniuk, L Faraone, A Rogalski
Applied Physics Reviews 1 (4), 041102, 2014
1522014
Stress in low-temperature plasma enhanced chemical vapour deposited silicon nitride thin films
M Martyniuk, J Antoszewski, CA Musca, JM Dell, L Faraone
Smart materials and structures 15 (1), S29, 2005
552005
Effects of deposition temperature on the mechanical and physical properties of silicon nitride thin films
BA Walmsley, Y Liu, XZ Hu, MB Bush, KJ Winchester, M Martyniuk, ...
Journal of applied physics 98 (4), 044904, 2005
412005
Ultrathin tunable terahertz absorber based on MEMS-driven metamaterial
M Liu, M Susli, D Silva, G Putrino, H Kala, S Fan, M Cole, L Faraone, ...
Microsystems & nanoengineering 3 (1), 1-6, 2017
402017
Nanoindentation of HgCdTe prepared by molecular beam epitaxy
M Martyniuk, RH Sewell, CA Musca, JM Dell, L Faraone
Applied Physics Letters 87 (25), 251905, 2005
282005
Local bonding environment of plasma deposited nitrogen-rich silicon nitride thin films
MTK Soh, N Savvides, CA Musca, MP Martyniuk, L Faraone
Journal of applied physics 97 (9), 093714, 2005
262005
Uniform dispersion of lanthanum hexaboride nanoparticles in a silica thin film: synthesis and optical properties
F Jiang, YK Leong, M Saunders, M Martyniuk, L Faraone, A Keating, ...
ACS applied materials & interfaces 4 (11), 5833-5838, 2012
252012
Towards MEMS based infrared tunable micro-spectrometers
J Antoszewski, J Dell, T Shivakumar, M Martyniuk, K Winchester, ...
Proc. SPIE 4935, 148, 2002
252002
Environmental stability and cryogenic thermal cycling of low-temperature plasma-deposited silicon nitride thin films
M Martyniuk, J Antoszewski, CA Musca, JM Dell, L Faraone
Journal of applied physics 99 (5), 053519, 2006
232006
Determination of residual stress in low-temperature PECVD silicon nitride thin films
MP Martyniuk, J Antoszewski, CA Musca, JM Dell, L Faraone
Device and Process Technologies for MEMS, Microelectronics, and Photonics …, 2004
192004
Model and analysis of a high sensitivity resonant optical read-out approach suitable for cantilever sensor arrays
G Putrino, A Keating, M Martyniuk, L Faraone, J Dell
Journal of lightwave technology 30 (12), 1863-1868, 2012
182012
Determination of mechanical properties of silicon nitride thin films using nanoindentation
M Martyniuk, J Antoszewski, BA Walmsley, CA Musca, JM Dell, YG Jung, ...
Spaceborne Sensors II 5798, 216-225, 2005
162005
Process control of cantilever deflection for sensor application based on optical waveguides
F Jiang, A Keating, M Martyniuk, R Pratap, L Faraone, JM Dell
journal of microelectromechanical systems 22 (3), 569-579, 2012
152012
Characterization of low-temperature bulk micromachining of silicon using an SF6/O2 inductively coupled plasma
F Jiang, A Keating, M Martyniuk, K Prasad, L Faraone, JM Dell
Journal of Micromechanics and Microengineering 22 (9), 095005, 2012
152012
Large-area MEMS tunable Fabry–Pérot filters for multi/hyperspectral infrared imaging
H Mao, DK Tripathi, Y Ren, KD Silva, M Martyniuk, J Antoszewski, ...
IEEE Journal of Selected Topics in Quantum Electronics 23 (2), 45-52, 2016
132016
MEMS-based tunable Fabry–Perot filters for adaptive multispectral thermal imaging
H Mao, KD Silva, M Martyniuk, J Antoszewski, J Bumgarner, BD Nener, ...
Journal of Microelectromechanical Systems 25 (1), 227-235, 2016
132016
Low-temperature micro-opto-electro-mechanical technologies for temperature sensitive substrates
M Martyniuk
University of Western Australia, 2006
132006
Evaluation Of Elastic Modulus And Stress Gradient Of PECVD Silicon Nitride Thin Films
H Huang, K Winchester, J Antoszewski, T Nguyun, M Martyniuk, ...
Structural Integrity and Fracture International Conference (SIF'04), 149-154, 2004
132004
On-chip read-out of picomechanical motion under ambient conditions
G Putrino, M Martyniuk, A Keating, L Faraone, J Dell
Nanoscale 7 (5), 1927-1933, 2015
122015
Nie można teraz wykonać tej operacji. Spróbuj ponownie później.
Prace 1–20