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Andrzej Taube
Andrzej Taube
Łukasiewicz Research Network - Institute of Microelectronics and Photonics, Warsaw, Poland
Verified email at ite.waw.pl
Title
Cited by
Cited by
Year
Temperature-Dependent Thermal Properties of Supported MoS2 Monolayers
A Taube, J Judek, A Łapińska, M Zdrojek
ACS applied materials & interfaces 7 (9), 5061-5065, 2015
2292015
Temperature dependence of Raman shifts in layered ReSe2 and SnSe2 semiconductor nanosheets
A Taube, A Łapińska, J Judek, M Zdrojek
Applied Physics Letters 107 (1), 2015
1202015
Temperature-Dependent Nonlinear Phonon Shifts in a Supported MoS2 Monolayer
A Taube, J Judek, C Jastrzębski, A Duzynska, K Świtkowski, M Zdrojek
ACS applied materials & interfaces 6 (12), 8959-8963, 2014
922014
Temperature evolution of phonon properties in few-layer black phosphorus
A Łapińska, A Taube, J Judek, M Zdrojek
The Journal of Physical Chemistry C 120 (9), 5265-5270, 2016
692016
Graphene-based plastic absorber for total sub-terahertz radiation shielding
M Zdrojek, J Bomba, A Łapińska, A Dużyńska, K Żerańska-Chudek, ...
Nanoscale 10 (28), 13426-13431, 2018
502018
Ion implantation for isolation of AlGaN/GaN HEMTs using C or Al
A Taube, E Kamińska, M Kozubal, J Kaczmarski, W Wojtasiak, J Jasiński, ...
physica status solidi (a) 212 (5), 1162-1169, 2015
472015
AlGaN/GaN high electron mobility transistors on semi-insulating Ammono-GaN substrates with regrown ohmic contacts
W Wojtasiak, M Góralczyk, D Gryglewski, M Zając, R Kucharski, ...
Micromachines 9 (11), 546, 2018
402018
Temperature-dependent thermal properties of single-walled carbon nanotube thin films
A Duzynska, A Taube, KP Korona, J Judek, M Zdrojek
Applied Physics Letters 106 (18), 183108, 2015
402015
Electronic Properties of Thin HfO Films Fabricated by Atomic Layer Deposition on 4H-SiC
A Taube, S Gierałtowska, T Gutt, T Małachowski, I Pasternak, ...
Acta Physica Polonica A 119 (5), 696-698, 2011
352011
Temperature induced phonon behaviour in germanium selenide thin films probed by Raman spectroscopy
A Taube, A Łapińska, J Judek, N Wochtman, M Zdrojek
Journal of Physics D: Applied Physics 49 (31), 315301, 2016
332016
Raman spectra of high-κ dielectric layers investigated with micro-Raman spectroscopy comparison with silicon dioxide
P Borowicz, A Taube, W Rzodkiewicz, M Latek, S Gierałtowska
The Scientific World Journal 2013, 2013
292013
Temperature-dependent electrical characterization of high-voltage AlGaN/GaN-on-Si HEMTs with Schottky and ohmic drain contacts
A Taube, J Kaczmarski, R Kruszka, J Grochowski, K Kosiel, ...
Solid-State Electronics 111, 12-17, 2015
262015
Application of deposited by ALD HfO2 and Al2O3 layers in double-gate dielectric stacks for non-volatile semiconductor memory (NVSM) devices
R Mroczyński, A Taube, S Gierałtowska, E Guziewicz, M Godlewski
Applied surface science 258 (21), 8366-8370, 2012
202012
Effect of the post-deposition annealing on electrical characteristics of MIS structures with HfO2/SiO2 gate dielectric stacks
A Taube, R Mroczyński, K Korwin-Mikke, S Gierałtowska, J Szmidt, ...
Materials Science and Engineering: B 177 (15), 1281-1285, 2012
192012
Characterization of Al2O3/4H-SiC and Al2O3/SiO2/4H-SiC MOS structures
K Kosiel, K Król, A Taube, M Guziewicz, K Gołaszewska-Malec, R Kruszka, ...
Bulletin of the Polish Academy of Sciences: Technical Sciences, 2016
172016
Enhancement of Ru-Si-O/In-Ga-Zn-O MESFET performance by reducing depletion region trap density
J Kaczmarski, J Grochowski, E Kaminska, A Taube, M Borysiewicz, ...
IEEE Electron Device Letters, 2015
172015
Raman spectroscopy of layered lead tin disulfide (PbSnS2) thin films
A Łapińska, A Taube, M Wąsik, GZ Żukowska, A Duzynska, J Judek, ...
Journal of Raman Spectroscopy 48 (3), 479-484, 2017
162017
Transparent Ru–Si–O/In–Ga–Zn–O MESFETs on flexible polymer substrates
J Kaczmarski, A Taube, MA Borysiewicz, M Myśliwiec, K Piskorski, ...
IEEE Transactions on Electron Devices 65 (1), 129-135, 2017
162017
In–Ga–Zn–O MESFET with transparent amorphous Ru–Si–O Schottky barrier
J Kaczmarski, J Grochowski, E Kaminska, A Taube, W Jung, A Piotrowska
physica status solidi (RRL)–Rapid Research Letters 8 (7), 625-628, 2014
152014
Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures
A Domanowska, M Miczek, R Ucka, M Matys, B Adamowicz, J Żywicki, ...
Applied surface science 258 (21), 8354-8359, 2012
152012
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