Julianna Kostencka
TitleCited byYear
Noise suppressed optical diffraction tomography with autofocus correction
J Kostencka, T Kozacki, M Dudek, M Kujawińska
Optics express 22 (5), 5731-5745, 2014
342014
Accurate approach to capillary-supported optical diffraction tomography
J Kostencka, T Kozacki, A Ku¶, M Kujawińska
Optics Express 23 (6), 7908-7923, 2015
312015
Autofocusing method for tilted image plane detection in digital holographic microscopy
J Kostencka, T Kozacki, K Liżewski
Optics Communications 297, 20-26, 2013
292013
Holographic tomography with scanning of illumination: space-domain reconstruction for spatially invariant accuracy
J Kostencka, T Kozacki, A Ku¶, B Kemper, M Kujawińska
Biomedical optics express 7 (10), 4086-4101, 2016
252016
Holographic method for topography measurement of highly tilted and high numerical aperture micro structures
T Kozacki, K Liżewski, J Kostencka
Optics & Laser Technology 49, 38-46, 2013
232013
Computational and experimental study on accuracy of off-axis reconstructions in optical diffraction tomography
J Kostencka, T Kozacki
Optical Engineering 54 (2), 024107, 2015
202015
Problems and solutions in 3-D analysis of phase biological objects by optical diffraction tomography
M Kujawińska, W Krauze, A Kus, J Kostencka, T Kozacki, B Kemper, ...
International Journal of Optomechatronics 8 (4), 357-372, 2014
182014
High-precision topography measurement through accurate in-focus plane detection with hybrid digital holographic microscope and white light interferometer module
K Liżewski, S Tomczewski, T Kozacki, J Kostencka
Applied optics 53 (11), 2446-2454, 2014
152014
Absolute shape measurement of high NA focusing microobjects in digital holographic microscope with arbitrary spherical wave illumination
T Kozacki, K Liżewski, J Kostencka
Optics express 22 (14), 16991-17005, 2014
132014
Digital holographic microscope for measurement of high gradient deep topography object based on superresolution concept
K Liżewski, T Kozacki, J Kostencka
Optics letters 38 (11), 1878-1880, 2013
122013
Holographic method for capillary induced aberration compensation for 3D tomographic measurements of living cells
J Kostencka, T Kozacki, A Ku¶, M Dudek, M Kujawińska, B Kemper
Optical Methods for Inspection, Characterization, and Imaging of …, 2013
102013
Holographic tomography with object rotation and two-directional off-axis illumination
J Kostencka, T Kozacki, M Józwik
Optics express 25 (20), 23920-23934, 2017
92017
Accurate shape measurement of focusing microstructures in Fourier digital holographic microscopy
M Mikuła, T Kozacki, M Józwik, J Kostencka
Applied optics 57 (1), A197-A204, 2018
82018
Digital holography with multidirectional illumination by LCoS SLM for topography measurement of high gradient reflective microstructures
M Józwik, T Kozacki, K Liżewski, J Kostencka
Applied optics 54 (9), 2283-2288, 2015
82015
Off-axis illumination in object-rotation diffraction tomography for enhanced alignment and resolution
J Kostencka, T Kozacki
Optical Measurement Systems for Industrial Inspection IX 9525, 95250M, 2015
42015
Time efficient method for defocus error compensation in tomographic phase microscopy
J Kostencka, T Kozacki, M Dudek, M Kujawińska
Photonics Letters of Poland 6 (3), 102-104, 2014
42014
Holographic contouring with multiple incidence angles
T Kozacki, M Mikuła, J Kostencka, M Józwik
Digital Holography and Three-Dimensional Imaging, M4A. 4, 2017
32017
On accuracy of holographic shape measurement method with spherical wave illumination
M Mikuła, T Kozacki, J Kostencka, K Liżewski, M Józwik
Photonics Applications in Astronomy, Communications, Industry, and High …, 2014
32014
On topography characterization of micro-optical elements with large numerical aperture using digital holographic microscopy
K Liżewski, T Kozacki, M Józwik, J Kostencka
Optical Micro-and Nanometrology IV 8430, 84300G, 2012
32012
Influence of the limited detector size on spatial variations of the reconstruction accuracy in holographic tomography
J Kostencka, T Kozacki, B Hennelly, JT Sheridan
Optical Measurement Systems for Industrial Inspection X 10329, 103292W, 2017
22017
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Articles 1–20