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- Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityVerified email at vanderbilt.edu
- Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt UniversityVerified email at vanderbilt.edu
- Robert A ReedVanderbilt UniversityVerified email at vanderbilt.edu
- Arthur WitulskiResearch Professor Electrical Engineering, Vanderbilt UniversityVerified email at vanderbilt.edu
- Andrew SternbergVanderbilt UniversityVerified email at vanderbilt.edu
- Arto JavanainenJyväskylä UniversityVerified email at jyu.fi
- Enxia ZhangUniversity of Central FloridaVerified email at ucf.edu
- Michael AllesVanderbilt UniversityVerified email at vanderbilt.edu
- Lloyd MassengillVanderbilt UniversityVerified email at vanderbilt.edu
- C. ClaeysProfessor KU LeuvenVerified email at kuleuven.be
- Bo Kyoung ChoiMTEGVerified email at mteg.co.kr
- Robert A. WellerVanderbilt UniversityVerified email at vanderbilt.edu
- Steven KosierVanderbilt UniversityVerified email at Vanderbilt.edu
- Brian SierawskiResearch Associate Professor, Vanderbilt UniversityVerified email at vanderbilt.edu
- jerome bochmontpellier universityVerified email at umontpellier.fr
- Ari VirtanenUniversity of JyväskyläVerified email at jyu.fi
- Chaoming LiuHarbin Institute of TechnologyVerified email at hit.edu.cn
- Dale P. McMorrowNaval Research LaboratoryVerified email at nrl.navy.mil
- Dunbar P. Birnie, IIIRutgers UniversityVerified email at rutgers.edu
- Liang WangBeijing Microelectronics Technology InstituteVerified email at vanderbilt.edu