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Paweł Piotr Michałowski
Paweł Piotr Michałowski
Łukasiewicz Research Network - Institute of Microelectronics and Photonics
Zweryfikowany adres z imif.lukasiewicz.gov.pl
Tytuł
Cytowane przez
Cytowane przez
Rok
Self-organized multi-layered graphene–boron-doped diamond hybrid nanowalls for high-performance electron emission devices
KJ Sankaran, M Ficek, S Kunuku, K Panda, CJ Yeh, JY Park, M Sawczak, ...
Nanoscale 10 (3), 1345-1355, 2018
672018
Oxycarbide MXenes and MAX phases identification using monoatomic layer-by-layer analysis with ultralow-energy secondary-ion mass spectrometry
PP Michałowski, M Anayee, TS Mathis, S Kozdra, A Wójcik, ...
Nature Nanotechnology 17 (11), 1192-1197, 2022
642022
Atomic Layer Deposition of Titanium Dioxide Thin Films from Cp*Ti(OMe)3 and Ozone
M Rose, J Niinistö, P Michalowski, L Gerlich, L Wilde, I Endler, ...
The Journal of Physical Chemistry C 113 (52), 21825-21830, 2009
622009
Influence of silicon layers on the growth of ITO and AZO in silicon heterojunction solar cells
A Cruz, F Ruske, A Eljarrat, PP Michalowski, AB Morales-Vilches, ...
IEEE Journal of Photovoltaics 10 (2), 703-709, 2019
412019
Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline Devices Studied With AFM-Related Techniques
M Lanza, M Porti, M Nafria, X Aymerich, G Benstetter, E Lodermeier, ...
IEEE transactions on nanotechnology 10 (2), 344-351, 2010
382010
Crystallization and silicon diffusion nanoscale effects on the electrical properties of Al2O3 based devices
M Lanza, M Porti, M Nafria, X Aymerich, G Benstetter, E Lodermeier, ...
Microelectronic engineering 86 (7-9), 1921-1924, 2009
312009
Secondary ion mass spectroscopy depth profiling of hydrogen-intercalated graphene on SiC
PP Michałowski, W Kaszub, A Merkulov, W Strupiński
Applied Physics Letters 109 (1), 2016
252016
Influence of hydrogen intercalation on graphene/Ge (0 0 1)/Si (0 0 1) interface
J Grzonka, I Pasternak, PP Michałowski, V Kolkovsky, W Strupinski
Applied Surface Science 447, 582-586, 2018
212018
Graphene enhanced secondary ion mass spectrometry (GESIMS)
PP Michałowski, W Kaszub, I Pasternak, W Strupiński
Scientific Reports 7 (1), 7479, 2017
212017
Crystallisation Phenomena of In2O3:H Films
R Muydinov, A Steigert, M Wollgarten, PP Michałowski, U Bloeck, A Pflug, ...
Materials 12 (2), 266, 2019
202019
Magnetic Domains without Domain Walls: A Unique Effect of Ion Bombardment in Ferrimagnetic Films
Ł Frąckowiak, P Kuświk, GD Chaves-O’Flynn, M Urbaniak, M Matczak, ...
Physical Review Letters 124 (4), 047203, 2020
192020
Thermally activated double-carrier transport in epitaxial graphene on vanadium-compensated 6H-SiC as revealed by Hall effect measurements
T Ciuk, A Kozlowski, PP Michalowski, W Kaszub, M Kozubal, Z Rekuc, ...
Carbon 139, 776-781, 2018
192018
The role of hydrogen in carbon incorporation and surface roughness of MOCVD-grown thin boron nitride
PA Caban, D Teklinska, PP Michalowski, J Gaca, M Wojcik, J Grzonka, ...
Journal of Crystal Growth 498, 71-76, 2018
192018
Oxygen-induced high diffusion rate of magnesium dopants in GaN/AlGaN based UV LED heterostructures
PP Michałowski, S Złotnik, J Sitek, K Rosiński, M Rudziński
Physical Chemistry Chemical Physics 20 (20), 13890-13895, 2018
172018
TaN metal gate damage during high-k (Al2O3) high-temperature etch
J Paul, V Beyer, P Michalowski, MF Beug, L Bach, M Ackermann, S Wege, ...
Microelectronic engineering 86 (4-6), 949-952, 2009
172009
Titanium nitride as a plasmonic material from near-ultraviolet to very-long-wavelength infrared range
J Judek, P Wróbel, PP Michałowski, M Ożga, B Witkowski, A Seweryn, ...
Materials 14 (22), 7095, 2021
162021
Proximity-induced magnetism and the enhancement of damping in ferromagnetic/heavy metal systems
C Swindells, H Głowiński, Y Choi, D Haskel, PP Michałowski, T Hase, ...
Applied Physics Letters 119 (15), 2021
112021
Locally‐Strain‐Induced Heavy‐Hole‐Band Splitting Observed in Mobility Spectrum of p‐Type InAs Grown on GaAs
J Wróbel, GA Umana-Membreno, J Boguski, D Sztenkiel, PP Michałowski, ...
physica status solidi (RRL)–Rapid Research Letters 14 (4), 1900604, 2020
112020
Contamination-free Ge-based graphene as revealed by graphene enhanced secondary ion mass spectrometry (GESIMS)
PP Michałowski, I Pasternak, W Strupiński
Nanotechnology 29 (1), 015702, 2017
112017
Growth and thermal annealing for acceptor activation of p-type (Al) GaN epitaxial structures: Technological challenges and risks
S Zlotnik, J Sitek, K Rosiński, PP Michałowski, J Gaca, M Wójcik, ...
Applied Surface Science 488, 688-695, 2019
102019
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