| Calculation of the internal thermal resistance and ampacity of 3-core screened cables with fillers GJ Anders, A Napieralski, Z Kulesza IEEE transactions on power delivery 14 (3), 729-734, 1999 | 38 | 1999 |
| Real-time prediction of acute cardiovascular events using hardware-implemented Bayesian networks W Tylman, T Waszyrowski, A Napieralski, M Kamiński, T Trafidło, ... Computers in Biology and Medicine 69, 245-253, 2016 | 25 | 2016 |
| Automatic people identification on the basis of iris pattern-extraction features and classification R Szewczyk, P Jablonski, Z Kulesza, A Napieralski, J Cabestany, ... 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No …, 2002 | 23 | 2002 |
| Automated stand for thermal characterization of electronic packages M Janicki, Z Kulesza, T Torzewicz, A Napieralski 2011 27th Annual IEEE Semiconductor Thermal Measurement and Management …, 2011 | 21 | 2011 |
| Implementation of Bayesian network in FPGA circuit Z Kulesza, W Tylman Proceedings of the International Conference Mixed Design of Integrated …, 2006 | 15 | 2006 |
| Design of the test ASIC for on-line temperature monitoring and thermal structure analysis M Szermer, Z Kulesza, M Janicki, A Napieralski 2008 15th International Conference on Mixed Design of Integrated Circuits …, 2008 | 13 | 2008 |
| Automatic people identification on the basis of iris pattern-image processing and preliminary analysis P Jablonski, R Szewczyk, Z Kulesza, A Napieralski, M Moreno, ... 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No …, 2002 | 11 | 2002 |
| Multichannel system for real time registration of electronic circuit temperature response M Janicki, Z Kulesza, P Pietrzak, A Napieralski Proceedings of the 17th International Conference Mixed Design of Integrated …, 2010 | 10 | 2010 |
| Test ASIC for real time estimation of chip temperature M Szermer, Z Kulesza, M Janicki, A Napieralski Proc. 10th NSTI Nanotechnology Conf. Nanotech 3, 529-532, 2008 | 10 | 2008 |
| Accuracy and boundary condition independence of Cauer RC ladder compact thermal models M Janicki, T Torzewicz, Z Kulesza, A Napieralski Microelectronics Journal 44 (7), 619-622, 2013 | 6 | 2013 |
| Active control of boundary conditions for dynamic thermal characterization of electronic components M Janicki, T Torzewicz, Z Kulesza, A Napieralski Microelectronics Journal 44 (11), 1019-1024, 2013 | 5 | 2013 |
| Practical study of temperature distribution in a thermal test integrated circuit M Janicki, M Szermer, S Klab, Z Kulesza, A Napieralski 2009 15th International Workshop on Thermal Investigations of ICs and …, 2009 | 5 | 2009 |
| System for estimation of patient’s state–discussion of the approach W Tylman, T Waszyrowski, A Napieralski, M Kamiński, Z Kulesza, R Kotas, ... New Results in Dependability and Computer Systems: Proceedings of the 8th …, 2013 | 4 | 2013 |
| Active control of circuit cooling conditions for transient thermal measurement purposes M Janicki, Z Kulesza, T Torzewicz, A Napieralski 2011 17th International Workshop on Thermal Investigations of ICs and …, 2011 | 3 | 2011 |
| Distributed network of remote sensors for real time prediction of hot spot temperature values M Janicki, Z Kulesza, A Napieralski SENSORS, 2010 IEEE, 656-659, 2010 | 3 | 2010 |
| Scripting languages for simulations in modern SCADA systems P Marciniak, Z Kulesza, A Napieralski, R Kotas Proceedings of the 17th International Conference Mixed Design of Integrated …, 2010 | 3 | 2010 |
| Practical realization of PTAT sensor for ASIC overheat protection M Szermer, M Janicki, Z Kulesza, A Napieralski 2009 15th International Workshop on Thermal Investigations of ICs and …, 2009 | 3 | 2009 |
| Modelling of Transmission Lines Inside Modern Integrated Semiconductor and Test Boards M Zubert, M Jankowski, Z Kulesza, A Napieralski IEEE Access 9, 87182-87195, 2021 | 2 | 2021 |
| Dual cold plate system with active temperature and heat flux control M Janicki, Z Kulesza, T Torzewicz, A Napieralski 18th International Workshop on THERMal INvestigation of ICs and Systems, 1-4, 2012 | 2 | 2012 |
| Boundary condition independence of Cauer RC ladder compact thermal models M Janicki, T Torzewicz, Z Kulesza, A Napieralski Proc. of Nanotech 2, 833-836, 2012 | 2 | 2012 |
Andrzej NapieralskiProfessor, Lodz University of TechnologyVerified email at dmcs.pl
