Temperature and injection dependence of the Shockley–Read–Hall lifetime in electron irradiated n ‐type silicon H Bleichner, P Jonsson, N Keskitalo, E Nordlander
Journal of Applied Physics 79 (12), 9142-9148, 1996
91 1996 The ambipolar diffusion coefficient in silicon: Dependence on excess‐carrier concentration and temperature M Rosling, H Bleichner, P Jonsson, E Nordlander
Journal of applied physics 76 (5), 2855-2859, 1994
84 1994 The ambipolar Auger coefficient: Measured temperature dependence in electron irradiated and highly injected n-type silicon P Jonsson, H Bleichner, M Isberg, E Nordlander
Journal of applied physics 81 (5), 2256-2262, 1997
52 1997 On the concept image of complex numbers MC Nordlander, E Nordlander
International Journal of Mathematical Education in Science and Technology 43 …, 2012
49 2012 A novel technique for the simultaneous measurement of ambipolar carrier lifetime and diffusion coefficient in silicon M Rosling, H Bleichner, M Lundqvist, E Nordlander
Solid-state electronics 35 (9), 1223-1227, 1992
32 1992 Temperature and injection dependence of the Shockley–Read–Hall lifetime in electron-irradiated -type silicon N Keskitalo, P Jonsson, K Nordgren, H Bleichner, E Nordlander
Journal of applied physics 83 (8), 4206-4212, 1998
27 1998 A time-resolved optical system for spatial characterization of the carrier distribution in a gate turn-off thyristor (GTO) H Bleichner, E Nordlander, M Rosling, S Berg
IEEE transactions on instrumentation and measurement 39 (3), 473-478, 1990
25 1990 A study of turn-off limitations and failure mechanisms of GTO thyristors by means of 2-D time-resolved optical measurements H Bleichner, M Bakowski, M Rosling, E Nordlander, J Vobecky, ...
Solid-state electronics 35 (11), 1683-1695, 1992
24 1992 Influence of students’ attitudes and beliefs on the ability of solving mathematical problems with irrelevant information MC Nordlander, E Nordlander
Beliefs and attitudes in mathematics education, 165-178, 2009
18 2009 Vad tycker tekniklärarna? E Nordlander
Teknikutbildning för framtiden, 90-102, 2011
15 2011 An optical system for bilateral recombination-radiation diagnostics of the carrier redistribution in switching power devices M Lundqvist, H Bleichner, E Nordlander
IEEE transactions on instrumentation and measurement 40 (6), 956-961, 1991
11 1991 Flying-spot scanning for the separate mapping of resistivity and minority-carrier lifetime in silicon H Bleichner, E Nordlander, G Fiedler, PA Tove
Solid-state electronics 29 (8), 779-786, 1986
9 1986 Laser scanning technique for the detection of resistivity inhomogeneities in silicon using liquid rectifying contacts B Drugge, E Nordlander
IEEE transactions on electron Devices 27 (11), 2124-2127, 1980
9 1980 Teknik i skolan–en utmaning för samhället E Nordlander, J Grenholm
Gävle University Press, 2016
8 2016 Measurements of failure phenomena in inductively loaded multi-cathode GTO thyristors H Bleichner, M Rosling, M Bakowski, J Vobecky, E Nordlander
IEEE transactions on electron devices 41 (2), 251-257, 1994
8 1994 A comparative study of the carrier distributions in dynamically operating GTO's by means of two optically probed measurement methods H Bleichner, M Rosling, J Vobecky, M Lundqvist, E Nordlander
Proceedings of the 2nd International Symposium on Power Semiconductor …, 1990
8 1990 Teknikutbildning för framtiden: perspektiv på teknikundervisningen i grundskola och gymnasium SO Hansson, E Nordlander, IB Skogh
Liber, 2011
7 2011 The effect of emitter shortings on turn-off limitations and device failure in GTO thyristors under snubberless operation H Bleichner, K Nordgren, M Rosling, M Bakowski, E Nordlander
IEEE transactions on electron devices 42 (1), 178-187, 1995
7 1995 On the concept image of complex numbers M Cortas Nordlander, E Nordlander
International journal of mathematical education in science and technology 43 …, 2012
5 2012 Komplexa tal är inte så komplexa! MC Nordlander, E Nordlander
Hämtad från NCM: Nationellt centrum för matematikutbildning: http://ncm. gu …, 2010
5 2010