Ashok Raman
Cited by
Cited by
Nonuniform total-dose-induced charge distribution in shallow-trench isolation oxides
M Turowski, A Raman, RD Schrimpf
IEEE transactions on nuclear science 51 (6), 3166-3171, 2004
Finite-time stabilization of fractional order uncertain chain of integrator: an integral sliding mode approach
S Kamal, A Raman, B Bandyopadhyay
IEEE Transactions on Automatic Control 58 (6), 1597-1602, 2012
Fast, automated thermal simulation of three-dimensional integrated circuits
P Wilkerson, A Raman, M Turowski
The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena …, 2004
Simulation of nonequilibrium thermal effects in power LDMOS transistors
A Raman, DG Walker, TS Fisher
Solid-State Electronics 47 (8), 1265-1273, 2003
An evaluation of transistor-layout RHBD techniques for SEE mitigation in SiGe HBTs
AK Sutton, M Bellini, JD Cressler, JA Pellish, RA Reed, PW Marshall, ...
IEEE Transactions on Nuclear Science 54 (6), 2044-2052, 2007
Mixed-mode simulation and analysis of digital single event transients in fast CMOS ICs
M Turowski, A Raman, G Jablonski
Mixed Design of Integrated Circuits and Systems, 2007. MIXDES'07. 14th …, 2007
Heavy ion microbeam-and broadbeam-induced transients in SiGe HBTs
JA Pellish, RA Reed, D McMorrow, G Vizkelethy, VF Cavrois, J Baggio, ...
IEEE Transactions on Nuclear Science 56 (6), 3078-3084, 2009
Single event transient response of SiGe voltage references and its impact on the performance of analog and mixed-signal circuits
L Najafizadeh, SD Phillips, KA Moen, RM Diestelhorst, M Bellini, PK Saha, ...
IEEE Transactions on Nuclear Science 56 (6), 3469-3476, 2009
Temperature-dependence of off-state drain leakage in X-ray irradiated 130 nm CMOS devices
B Jun, RM Diestelhorst, M Bellini, G Espinel, A Appaswamy, APG Prakash, ...
IEEE transactions on nuclear science 53 (6), 3203-3209, 2006
Single-event burnout of SiC junction barrier Schottky diode high-voltage power devices
AF Witulski, R Arslanbekov, A Raman, RD Schrimpf, AL Sternberg, ...
IEEE Transactions on Nuclear Science 65 (1), 256-261, 2017
Reconciling 3-D mixed-mode simulations and measured single-event transients in SiGe HBTs
M Turowski, JA Pellish, KA Moen, A Raman, JD Cressler, RA Reed, G Niu
IEEE Transactions on Nuclear Science 57 (6), 3342-3348, 2010
An investigation of single-event effects and potential SEU mitigation strategies in fourth-generation, 90 nm SiGe BiCMOS
NE Lourenco, SD Phillips, TD England, AS Cardoso, ZE Fleetwood, ...
IEEE Transactions on Nuclear Science 60 (6), 4175-4183, 2013
Simulating the radiation response of GaAs solar cells using a defect-based TCAD model
M Turowski, T Bald, A Raman, A Fedoseyev, JH Warner, CD Cress, ...
IEEE Transactions on Nuclear Science 60 (4), 2477-2485, 2013
Accurate modeling of single-event transients in a SiGe voltage reference circuit
KA Moen, L Najafizadeh, J Seungwoo, A Raman, M Turowski, ...
IEEE Transactions on Nuclear Science 58 (3), 877-884, 2011
The impact of technology scaling on the single-event transient response of SiGe HBTs
NE Lourenco, ZE Fleetwood, A Ildefonso, MT Wachter, NJH Roche, ...
IEEE Transactions on Nuclear Science 64 (1), 406-414, 2016
Digital single event transient pulse generation and propagation in fast bulk CMOS ICs
M Turowski, D Mavis, A Raman, P Eaton
2006 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 2006
Addressing challenges in device-circuit modeling for extreme environments of space
A Raman, M Turowski, A Fedoseyev, JD Cressler
Semiconductor Device Research Symposium, 2007 International, 2007
Single event upset modeling with nuclear reactions in nanoscale electronics
M Turowski, A Fedoseyev, A Raman, K Warren
2008 15th International Conference on Mixed Design of Integrated Circuits …, 2008
Enabling mixed-mode analysis of nano-scale SiGe BiCMOS technologies in extreme environments
M Turowski, A Raman, A Fedoseyev
2009 European Conference on Radiation and Its Effects on Components and …, 2009
Layout based full chip thermal simulations of stacked 3D integrated circuits
A Raman, M Turowski, M Mar
Int. Mechanical Engineering Congress and Exposition, IMECE-2003, 2003
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Articles 1–20